 | 2006 |
|---|
| 8 |       | L. Balado,
E. Lupon,
L. García,
Rosa Rodríguez-Montañés,
Joan Figueras:
Lissajous Based Mixed-Signal Testing for N-Observable Signals.
DDECS 2006: 125-130 |
| 2005 |
|---|
| 7 |  | R. Sanahuja,
V. Barcons,
L. Balado,
Joan Figueras:
Testing Biquad Filters under Parametric Shifts Using X-Y Zoning.
J. Electronic Testing 21(3): 257-265 (2005) |
| 2004 |
|---|
| 6 | | Marie-Lise Flottes,
Yves Bertrand,
L. Balado,
E. Lupon,
Anton Biasizzo,
Franc Novak,
Stefano Di Carlo,
Paolo Prinetto,
N. Pricopi,
Hans-Joachim Wunderlich:
Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ.
DELTA 2004: 135-139 |
| 5 | | Salvador Manich,
L. García,
L. Balado,
E. Lupon,
Josep Rius,
Rosa Rodríguez-Montañés,
Joan Figueras:
BIST Technique by Equally Spaced Test Vector Sequences.
VTS 2004: 206-216 |
| 4 | | Rosa Rodríguez-Montañés,
D. Muñoz,
L. Balado,
Joan Figueras:
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours.
J. Electronic Testing 20(2): 143-153 (2004) |
| 3 | | Marcelino B. Santos,
Isabel C. Teixeira,
João Paulo Teixeira,
Salvador Manich,
L. Balado,
Joan Figueras:
On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level.
J. Electronic Testing 20(4): 345-355 (2004) |
| 2003 |
|---|
| 2 | | Yves Bertrand,
Marie-Lise Flottes,
L. Balado,
Joan Figueras,
Anton Biasizzo,
Franc Novak,
Stefano Di Carlo,
Paolo Prinetto,
N. Pricopi,
Hans-Joachim Wunderlich,
J.-P. Van der Heyden:
Test Engineering Education in Europe: the EuNICE-Test Project.
MSE 2003: 85-86 |
| 2002 |
|---|
| 1 | | Rosa Rodríguez-Montañés,
D. Muñoz,
L. Balado,
Joan Figueras:
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours.
IOLTW 2002: 99-103 |
