W. David Ballew

	1992
3		W. David Ballew, Lauren M. Streb: Board-level boundary scan: regaining observability with an additional IC. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 68-75 (1992)
	1989
2		W. David Ballew, Lauren M. Streb: Board-Level Boundary-Scan: Regaining Observability with an Additional IC. ITC 1989: 182-189
	1988
1		W. David Ballew, Lauren M. Streb: Elimination of Incoming Test Based Upon In-Process Failure and Repair Costs. ITC 1988: 308-313

Coauthor Index

1

Lauren M. Streb

[1] [2] [3]