Yongchan Ban

	2008
2		Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan: ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction. DAC 2008: 504-509
1		Minsik Cho, Yongchan Ban, David Z. Pan: Double patterning technology friendly detailed routing. ICCAD 2008: 506-511

Coauthor Index

1	Minsik Cho	[1] [2]
2	David Z. Pan (David Zhigang Pan)	[1] [2]
3	Kun Yuan	[2]