 | 1992 |
|---|
| 15 |       | Paul H. Bardell:
Calculating the effects of linear dependencies in m-sequences used as test stimuli.
IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 83-86 (1992) |
| 14 | | Paul H. Bardell:
Discrete logarithms a parallel pseudorandom pattern generator analysis method.
J. Electronic Testing 3(1): 17-31 (1992) |
| 13 | | Paul H. Bardell:
Primitive polynomials of degree 301 through 500.
J. Electronic Testing 3(2): 175-176 (1992) |
| 1991 |
|---|
| 12 |  | Paul H. Bardell,
Michael J. Lapointe:
Production Experience with Built-In Self-Test in the IBM ES/9000 System.
ITC 1991: 28-36 |
| 11 | | Jacob Savir,
Paul H. Bardell:
Partitioning of polynomial tasks: test generation, an example.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(11): 1465-1468 (1991) |
| 1990 |
|---|
| 10 | | Paul H. Bardell:
Design considerations for Parallel pseudoRandom Pattern Generators.
J. Electronic Testing 1(1): 73-87 (1990) |
| 1989 |
|---|
| 9 | | Paul H. Bardell:
Calculating the Effects of Linear Dependencies in m-Sequences Used as Test Stimuli.
ITC 1989: 252-256 |
| 1986 |
|---|
| 8 | | Paul H. Bardell,
William H. McAnney:
Pseudorandom Arrays for Built-In Tests.
IEEE Trans. Computers 35(7): 653-658 (1986) |
| 1985 |
|---|
| 7 | | Paul H. Bardell,
William H. McAnney:
Self-Test of Random Access Memories.
ITC 1985: 352-355 |
| 1984 |
|---|
| 6 | | William H. McAnney,
Paul H. Bardell,
V. P. Gupta:
Random Testing for Stuck-At Storage Cells in an Embedded Memory.
ITC 1984: 157-166 |
| 5 | | Paul H. Bardell,
William H. McAnney:
Parallel Pseudorandom Sequences for Built-In Test.
ITC 1984: 302-308 |
| 4 | | Jacob Savir,
Gary S. Ditlow,
Paul H. Bardell:
Random Pattern Testability.
IEEE Trans. Computers 33(1): 79-90 (1984) |
| 3 | | Jacob Savir,
Paul H. Bardell:
On Random Pattern Test Length.
IEEE Trans. Computers 33(6): 467-474 (1984) |
| 1983 |
|---|
| 2 | | Jacob Savir,
Paul H. Bardell:
On Random Pattern Test Length.
ITC 1983: 95-107 |
| 1982 |
|---|
| 1 | | Paul H. Bardell,
William H. McAnney:
Self-Testing of Multichip Logic Modules.
ITC 1982: 200-204 |
