B. Basnar

	2001
1		M. Leicht, G. Fritzer, B. Basnar, S. Golka, J. Smoliner: A reliable course of Scanning Capacitance Microscopy analysis applied for 2D-Dopant Profilings of Power MOSFET Devices. Microelectronics Reliability 41(9-10): 1535-1537 (2001)

Coauthor Index

1	G. Fritzer	[1]
2	S. Golka	[1]
3	M. Leicht	[1]
4	J. Smoliner	[1]