Magali Bastian

	2009
11		Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: A new design-for-test technique for SRAM core-cell stability faults. DATE 2009: 1344-1348
	2008
10		Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: A Design-for-Diagnosis Technique for SRAM Write Drivers. DATE 2008: 1480-1485
9		Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert: A Novel Dummy Bitline Driver for Read Margin Improvement in an eSRAM. DELTA 2008: 107-110
8		Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert: Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects. ISVLSI 2008: 310-315
7		Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. VTS 2008: 89-94
	2007
6		Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Slow write driver faults in 65nm SRAM technology: analysis and March test solution. DATE 2007: 528-533
5		Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. European Test Symposium 2007: 97-104
4		Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. VTS 2007: 361-368
3		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electronic Testing 23(5): 435-444 (2007)
	2006
2		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS 2006: 256-261
	2005
1		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862

Coauthor Index

1	Luigi Dilillo	[1] [2] [3] [11]
2	Patrick Girard	[1] [2] [3] [4] [5] [6] [7] [10] [11]
3	Vincent Gouin	[7] [10] [11]
4	Christian Landrault	[4] [5] [6]
5	Philippe Maurine	[8] [9]
6	Michael Yap San Min	[8] [9]
7	Alexandre Ney	[4] [5] [6] [7] [10] [11]
8	Serge Pravossoudovitch	[1] [2] [3] [4] [5] [6] [7] [10] [11]
9	Michel Robert	[8] [9]
10	Arnaud Virazel	[1] [2] [3] [4] [5] [6] [7] [10] [11]

Colors in the list of coauthors