Jean-Christophe Batsale

	2004
2		Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale: Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. Microelectronics Journal 35(10): 811-816 (2004)
1		Josep Altet, J. M. Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby: Applications of temperature phase measurements to IC testing. Microelectronics Reliability 44(1): 95-103 (2004)

Coauthor Index

1	Josep Altet	[1]
2	Wilfrid Claeys	[1] [2]
3	Stefan Dilhaire	[1] [2]
4	Stéphane Grauby	[1] [2]
5	J. M. Rampnoux	[1]
6	Antonio Rubio	[1]