W. Bergbauer

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2006

1 W. Bergbauer, T. Lutz, Werner Frammelsberger, Guenther Benstetter: Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures. Microelectronics Reliability 46(9-11): 1736-1740 (2006)

	2006
1		W. Bergbauer, T. Lutz, Werner Frammelsberger, Guenther Benstetter: Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures. Microelectronics Reliability 46(9-11): 1736-1740 (2006)

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