Yves Bertrand

	2009
67		Florence Azaïs, Yves Bertrand, Michel Renovell: An analysis of the timing behavior of CMOS digital blocks under Simultaneous Switching Noise conditions. DDECS 2009: 158-163
	2008
66		Fabien Soulier, Lionel Gouyet, Guy Cathébras, Serge Bernard, David Guiraud, Yves Bertrand: Considerations on Improving the Design of CUFF Electrode for ENG Recording - Geometrical Approach, Dedicated IC, Sensitivity, Noise Rejection. BIODEVICES (2) 2008: 180-185
65		Fabien Soulier, Lionel Gouyet, Guy Cathébras, Serge Bernard, David Guiraud, Yves Bertrand: Multipolar Electrode and Preamplifier Design for ENG-Signal Acquisition. BIOSTEC (Selected Papers) 2008: 148-159
	2007
64		Mehdi Baba-ali, David Marcheix, Xavier Skapin, Yves Bertrand: Generic computation of bulletin boards into geometric kernels. Afrigraph 2007: 85-93
63		Sebastien Horna, Guillaume Damiand, Daniel Meneveaux, Yves Bertrand: Building 3D indoor scenes topology from 2D architectural plans. GRAPP (GM/R) 2007: 37-44
	2005
62		Jean Marc Gallière, Michel Renovell, Florence Azaïs, Yves Bertrand: Delay Testing Viability of Gate Oxide Short Defects. J. Comput. Sci. Technol. 20(2): 195-200 (2005)
61		Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. J. Electronic Testing 21(3): 291-298 (2005)
60		Sylvain Prat, Patrick Gioia, Yves Bertrand, Daniel Meneveaux: Connectivity compression in an arbitrary dimension. The Visual Computer 21(8-10): 876-885 (2005)
	2004
59		Marie-Lise Flottes, Yves Bertrand, L. Balado, E. Lupon, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich: Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ. DELTA 2004: 135-139
58		Guillaume Damiand, Yves Bertrand, Christophe Fiorio: Topological model for two-dimensional image representation: definition and optimal extraction algorithm. Computer Vision and Image Understanding 93(2): 111-154 (2004)
57		Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell: Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. J. Electronic Testing 20(3): 257-267 (2004)
56		Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. J. Electronic Testing 20(4): 375-387 (2004)
	2003
55		Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand: Delay Testing of MOS Transistor with Gate Oxide Short. Asian Test Symposium 2003: 168-173
54		Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell: A New Methodology For ADC Test Flow Optimization. ITC 2003: 201-209
53		Yves Bertrand, Marie-Lise Flottes, L. Balado, Joan Figueras, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich, J.-P. Van der Heyden: Test Engineering Education in Europe: the EuNICE-Test Project. MSE 2003: 85-86
52		Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei: An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test of Computers 20(1): 60-67 (2003)
51		Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand: Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short. J. Electronic Testing 19(4): 377-386 (2003)
50		Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell: On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. J. Electronic Testing 19(4): 469-479 (2003)
49		Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: A-to-D converters static error detection from dynamic parameter measurement. Microelectronics Journal 34(10): 945-953 (2003)
	2002
48		Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. DATE 2002: 1120
47		Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, Regis Lorival: European Network for Test Education. DELTA 2002: 230-234
46		Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems. VTS 2002: 439-444
45		Michel Renovell, Florence Azaïs, Yves Bertrand: Improving Defect Detection in Static-Voltage Testing. IEEE Design & Test of Computers 19(6): 83-89 (2002)
44		Franck Ledoux, Jean-Marc Mota, Agnès Arnould, Catherine Dubois, Pascale Le Gall, Yves Bertrand: Spécifications formelles du chanfreinage. Technique et Science Informatiques 21(8): 1073-1098 (2002)
	2001
43		Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: Implementation of a linear histogram BIST for ADCs. DATE 2001: 590-595
42		Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell: Analog BIST Generator for ADC Testing. DFT 2001: 338-346
41		Michel Renovell, Jean Marc Gallière, Florence Azaïs, Serge Bernard, Yves Bertrand: Boolean and current detection of MOS transistor with gate oxide short. ITC 2001: 1039-1048
40		Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. VLSI-SOC 2001: 425-436
39		Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing. VLSI-SOC 2001: 461-472
38		Florence Azaïs, Serge Bernard, Yves Bertrand, Xavier Michel, Michel Renovell: A Low-Cost Adaptive Ramp Generator for Analog BIST Applications. VTS 2001: 266-271
37		Franck Ledoux, Agnès Arnould, Pascale Le Gall, Yves Bertrand: Geometric Modelling with CASL. WADT 2001: 176-200
36		Sylvain Thery, Dominique Bechmann, Yves Bertrand: N-Dimensional Gregory-Bezier for N-Dimensional Cellular Complexes. WSCG (Short Papers) 2001: 16-23
35		André Ivanov, Sumbal Rafiq, Michel Renovell, Florence Azaïs, Yves Bertrand: On the detectability of CMOS floating gate transistor faults. IEEE Trans. on CAD of Integrated Circuits and Systems 20(1): 116-128 (2001)
34		Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs. J. Electronic Testing 17(2): 139-147 (2001)
33		Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. J. Electronic Testing 17(3-4): 255-266 (2001)
32		Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. J. Electronic Testing 17(5): 439-450 (2001)
	2000
31		Luigi Carro, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs, Michel Renovell: TI-BIST: a temperature independent analog BIST for switched-capacitor filters. Asian Test Symposium 2000: 78-83
30		Érika F. Cota, Michel Renovell, Florence Azaïs, Yves Bertrand, Luigi Carro, Marcelo Lubaszewski: Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. DATE 2000: 226-
29		Yves Bertrand, Guillaume Damiand, Christophe Fiorio: Topological Encoding of 3D Segmented Images. DGCI 2000: 311-324
28		Michel Renovell, Florence Azaïs, Serge Bernard, Yves Bertrand: Hardware Resource Minimization for Histogram-Based ADC BIST. VTS 2000: 247-254
27		Michel Renovell, Florence Azaïs, J-C. Bodin, Yves Bertrand: Combining Functional and Structural Approaches for Switched-Current Circuit Testing. J. Electronic Testing 16(3): 259-267 (2000)
26		Sylvain Brandel, Dominique Bechmann, Yves Bertrand: Thickening: an operation for animation. Journal of Visualization and Computer Animation 11(5): 261-277 (2000)
25		Jean Françon, Yves Bertrand: Topological 3D-manifolds: a statistical study of the cells. Theor. Comput. Sci. 234(1-2): 233-254 (2000)
	1999
24		Laurent Latorre, Yves Bertrand, P. Hazard, F. Pressecq, Pascal Nouet: Design, Characterization & Modelling of a CMOS Magnetic Field Sensor. DATE 1999: 239-243
23		Yves Bertrand, Christophe Fiorio, Yann Pennaneach: Border Map: A Topological Representation for nD Image Analysis. DGCI 1999: 242-257
22		Michel Renovell, André Ivanov, Yves Bertrand, Florence Azaïs, Sumbal Rafiq: Optimal conditions for Boolean and current detection of floating gate faults. ITC 1999: 477-486
21		Yves Bertrand, Florence Azaïs, Marie-Lise Flottes, Regis Lorival: A Successful Distance-Learning Experience for IC Test Education. MSE 1999: 20-21
20		Michel Renovell, Florence Azaïs, Yves Bertrand: Detection of Defects Using Fault Model Oriented Test Sequences. J. Electronic Testing 14(1-2): 13-22 (1999)
	1998
19		Michel Renovell, Florence Azaïs, J-C. Bodin, Yves Bertrand: BISTing Switched-Current Circuits. Asian Test Symposium 1998: 372-377
18		Florence Azaïs, André Ivanov, Michel Renovell, Yves Bertrand: A Methodology and Design for Effective Testing of Voltage-Controlled Oscillators (VCOs. Asian Test Symposium 1998: 383-387
17		Michel Renovell, Florence Azaïs, Yves Bertrand: Optimized Implementations of the Multi-Configuration DFT Technique for Analog Circuits. DATE 1998: 815-821
16		Florence Azaïs, Michel Renovell, Yves Bertrand, J-C. Bodin: Design-For-Testability for Switched-Current Circuits. VTS 1998: 370-375
	1997
15		A. Dargelas, C. Gauthron, Yves Bertrand: MOSAIC: a multiple-strategy oriented sequential ATPG for integrated circuits. ED&TC 1997: 29-36
14		Michel Renovell, Florence Azaïs, Yves Bertrand: On-chip analog output response compaction. ED&TC 1997: 568-572
13		Michel Renovell, Yves Bertrand: Test Strategy Sensitivity to Defect Parameters. ITC 1997: 607-616
	1996
12		Michel Renovell, P. Huc, Yves Bertrand: The Logic Threshold Based Voting: A Model for Local Feedback Bridging Fault. EDCC 1996: 205-213
11		Michel Renovell, P. Huc, Yves Bertrand: Bridging fault coverage improvement by power supply control. VTS 1996: 338-343
10		Michel Renovell, Florence Azaïs, Yves Bertrand: The multi-configuration: A DFT technique for analog circuits. VTS 1996: 54-59
	1995
9		Michel Renovell, P. Huc, Yves Bertrand: Serial transistor network modeling for bridging fault simulation. Asian Test Symposium 1995: 100-106
8		Michel Renovell, Florence Azaïs, Yves Bertrand: A design-for-test technique for multistage analog circuits. Asian Test Symposium 1995: 113-119
7		S. Lavabre, Yves Bertrand, Michel Renovell, Christian Landrault: Test configurations to enhance the testability of sequential circuits. Asian Test Symposium 1995: 160-168
6		Michel Renovell, P. Huc, Yves Bertrand: The concept of resistance interval: a new parametric model for realistic resistive bridging fault. VTS 1995: 184-189
	1994
5		Michel Renovell, P. Huc, Yves Bertrand: The Configuration Ratio: A Model for Simulating CMOS Intra-Gate Bridge with Variable Logic Thresholds. EDCC 1994: 165-177
4		Yves Bertrand, Jean-François Dufourd: Algebraic Specification of a 3D-Modeler Based on Hypermaps. CVGIP: Graphical Model and Image Processing 56(1): 29-60 (1994)
	1993
3		Yves Bertrand, Frédéric Bancel, Michel Renovell: Multiconfiguration Technique to Reduce Test Duration for Sequential Circuits. ITC 1993: 989-997
2		Yves Bertrand, Jean-François Dufourd, Jean Françon, Pascal Lienhardt: Algebraic Specification and Development in Geometric Modeling. TAPSOFT 1993: 75-89
1		Yves Bertrand, Frédéric Bancel, Michel Renovell: A DFT Technique to Improve ATPG Efficiency for Sequential Circuits. VLSI Design 1993: 51-54

Coauthor Index

1	Agnès Arnould	[37] [44]
2	Florence Azaïs	[8] [10] [14] [16] [17] [18] [19] [20] [21] [22] [27] [28] [30] [31] [33] [34] [35] [38] [40] [41] [42] [43] [45] [47] [49] [50] [51] [52] [54] [55] [56] [57] [61] [62] [67]
3	Mehdi Baba-ali	[64]
4	L. Balado	[53] [59]
5	Frédéric Bancel	[1] [3]
6	Dominique Bechmann	[26] [36]
7	Serge Bernard	[28] [33] [34] [38] [40] [41] [42] [43] [47] [49] [50] [54] [56] [57] [61] [65] [66]
8	Vincent Beroulle	[32] [39] [46] [48]
9	Anton Biasizzo	[53] [59]
10	J-C. Bodin	[16] [19] [27]
11	Sylvain Brandel	[26]
12	Stefano Di Carlo	[53] [59]
13	Luigi Carro	[30] [31]
14	Guy Cathébras	[65] [66]
15	Mariane Comte	[49] [54] [56] [57] [61]
16	Érika F. Cota	[30] [31]
17	Guillaume Damiand	[29] [58] [63]
18	A. Dargelas	[15]
19	Catherine Dubois	[44]
20	Jean-François Dufourd	[2] [4]
21	Joan Figueras	[53]
22	Christophe Fiorio	[23] [29] [58]
23	Marie-Lise Flottes	[21] [47] [53] [59]
24	Jean Françon	[2] [25]
25	Pascale Le Gall	[37] [44]
26	Jean Marc Gallière	[41] [51] [55] [62]
27	C. Gauthron	[15]
28	Patrick Gioia	[60]
29	Lionel Gouyet	[65] [66]
30	David Guiraud	[65] [66]
31	P. Hazard	[24]
32	J.-P. Van der Heyden	[53]
33	Sebastien Horna	[63]
34	P. Huc	[5] [6] [9] [11] [12]
35	André Ivanov	[18] [22] [35] [52]
36	Christian Landrault	[7]
37	Laurent Latorre	[24] [32] [39] [46] [47] [48]
38	S. Lavabre	[7]
39	Franck Ledoux	[37] [44]
40	Pascal Lienhardt	[2]
41	Regis Lorival	[21] [47]
42	Marcelo Lubaszewski	[30] [31]
43	E. Lupon	[59]
44	David Marcheix	[64]
45	Daniel Meneveaux	[60] [63]
46	Xavier Michel	[38]
47	Jean-Marc Mota	[44]
48	Pascal Nouet	[24] [32] [39] [46] [48]
49	Franc Novak	[53] [59]
50	Yann Pennaneach	[23]
51	Sylvain Prat	[60]
52	F. Pressecq	[24]
53	N. Pricopi	[53] [59]
54	Paolo Prinetto	[53] [59]
55	Sumbal Rafiq	[22] [35]
56	Michel Renovell	[1] [3] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [16] [17] [18] [19] [20] [22] [27] [28] [30] [31] [33] [34] [35] [38] [40] [41] [42] [43] [45] [49] [50] [51] [52] [54] [55] [56] [57] [61] [62] [67]
57	Xavier Skapin	[64]
58	Fabien Soulier	[65] [66]
59	Sassan Tabatabaei	[52]
60	Sylvain Thery	[36]
61	Hans-Joachim Wunderlich	[53] [59]

Colors in the list of coauthors