Matthias Beyer

	2006
3		Matthias Beyer, Winfried Dulz, Kai-Steffen Jens Hielscher: Performance issues in statistical testing. MMB 2006: 191-208
	2003
2		Matthias Beyer, Winfried Dulz, Fenhua Zhen: Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains. Asian Test Symposium 2003: 102-105
1		Matthias Beyer, Winfried Dulz: Scenario-Based Statistical Testing of Quality of Service Requirements. Scenarios: Models, Transformations and Tools 2003: 152-173

Coauthor Index

1	Winfried Dulz	[1] [2] [3]
2	Kai-Steffen Jens Hielscher	[3]
3	Fenhua Zhen	[2]