Xin Bi

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2008

1 Xin Bi, Han Ding: Detection of Local Mura Defects in TFT-LCD Using Machine Vision. ICIRA (1) 2008: 707-715

	2008
1		Xin Bi, Han Ding: Detection of Local Mura Defects in TFT-LCD Using Machine Vision. ICIRA (1) 2008: 707-715

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