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 | 2003 | |
|---|---|---|
| 1 |      | Hui-Yuan Song, S. Bohidar, R. Iris Bahar, Joel Grodstein: Symbolic Failure Analysis of Custom Circuits due to Excessive Leakage Current. ICCD 2003: 70-75 |
| 1 | R. Iris Bahar | [1] |
| 2 | Joel Grodstein | [1] |
| 3 | Hui-Yuan Song | [1] |