Pankaj Bolaki

	2004
2		Patrick J. Schroeder, Pankaj Bolaki, Vijayram Gopu: Comparing the Fault Detection Effectiveness of N-way and Random Test Suites. ISESE 2004: 49-59
	2003
1		Patrick J. Schroeder, Eok Kim, Jerry Arshem, Pankaj Bolaki: Combining Behavior and Data Modeling in Automated Test Case Generation. QSIC 2003: 247-254

Coauthor Index

1	Jerry Arshem	[1]
2	Vijayram Gopu	[2]
3	Eok Kim	[1]
4	Patrick J. Schroeder	[1] [2]