Samir Boubezari

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1999

4 Samir Boubezari, Eduard Cerny, Bozena Kaminska, Benoit Nadeau-Dostie: Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST. IEEE Trans. on CAD of Integrated Circuits and Systems 18(9): 1327-1340 (1999)

1996

3 Samir Boubezari, Bozena Kaminska: A new reconfigurable Test Vector Generator for built-in self-test applications. J. Electronic Testing 8(2): 153-164 (1996)

1995

2 Samir Boubezari, Bozena Kaminska: Mixed Deterministic and Pseudorandom Test Vector Generator Based on Cellular Automata Structures. ISCAS 1995: 1928-1931

1 Samir Boubezari, Bozena Kaminska: A Deterministic Built-In-Self-Test Generator Based on Cellular Automata Structures. IEEE Trans. Computers 44(6): 805-816 (1995)

	1999
4		Samir Boubezari, Eduard Cerny, Bozena Kaminska, Benoit Nadeau-Dostie: Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST. IEEE Trans. on CAD of Integrated Circuits and Systems 18(9): 1327-1340 (1999)
	1996
3		Samir Boubezari, Bozena Kaminska: A new reconfigurable Test Vector Generator for built-in self-test applications. J. Electronic Testing 8(2): 153-164 (1996)
	1995
2		Samir Boubezari, Bozena Kaminska: Mixed Deterministic and Pseudorandom Test Vector Generator Based on Cellular Automata Structures. ISCAS 1995: 1928-1931
1		Samir Boubezari, Bozena Kaminska: A Deterministic Built-In-Self-Test Generator Based on Cellular Automata Structures. IEEE Trans. Computers 44(6): 805-816 (1995)

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