Frank Bouwman

	2001
4		Bart Vermeulen, Steven Oostdijk, Frank Bouwman: Test and debug strategy of the PNX8525 NexperiaTM digital video platform system chip. ITC 2001: 121-130
	1994
3		Frank Bouwman, Taco Zwemstra, Sonny Hartanto, Keith Baker, Jan Koopmans: Application of Joint Time-Frequency Analysis in Mixed-Signal Testing. ITC 1994: 747-756
	1993
2		Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker: Minimizing Test Time by Exploiting Parallelism in Macro Test. ITC 1993: 451-460
	1992
1		Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker: Macro Testability: The Results of Production Device Applications. ITC 1992: 232-241

Coauthor Index

1	Keith Baker	[3]
2	Frans P. M. Beenker	[1] [2]
3	Ben Bennetts (R. G. Bennetts)	[1]
4	Hans Bouwmeester	[2]
5	Sonny Hartanto	[3]
6	Jan Koopmans	[3]
7	Steven Oostdijk	[1] [2] [4]
8	Rudi Stans	[1] [2]
9	Loek Thijssen	[2]
10	Bart Vermeulen	[4]
11	Taco Zwemstra	[3]

Colors in the list of coauthors