 | 2009 |
| 3 |  | Aymen Ladhar,
Mohamed Masmoudi,
Laroussi Bouzaida:
Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data.
DATE 2009: 988-993 |
| 2 |  | Youssef Benabboud,
Alberto Bosio,
Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Laroussi Bouzaida,
Isabelle Izaute:
Comprehensive bridging fault diagnosis based on the SLAT paradigm.
DDECS 2009: 264-269 |
| 1 |  | Youssef Benabboud,
Alberto Bosio,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Laroussi Bouzaida,
Isabelle Izaute:
A case study on logic diagnosis for System-on-Chip.
ISQED 2009: 253-259 |