P. Bove

	2003
1		M. Belhaj, C. Maneux, N. Labat, A. Touboul, P. Bove: High current effects in InP/GaAsSb/InP DHBT: Physical mechanisms and parasitic effects. Microelectronics Reliability 43(9-11): 1731-1736 (2003)

Coauthor Index

1	M. Belhaj	[1]
2	N. Labat	[1]
3	C. Maneux	[1]
4	A. Touboul	[1]