Kenneth M. Butler

	2007
34		Mohammad Tehranipoor, Kenneth M. Butler: Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs. IEEE Design & Test of Computers 24(3): 214-215 (2007)
33		Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler: Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 896-906 (2007)
	2006
32		Kenneth M. Butler: Guest Editor's Introduction: ITC Helps Get More Out of Test. IEEE Design & Test of Computers 23(5): 388-389 (2006)
	2004
31		Kenneth M. Butler: Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya. ITC 2004: 1419
30		Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington: Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC 2004: 355-364
	2003
29		Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger: A Case Study of IR-Drop in Structured At-Speed Testing. ITC 2003: 1098-1104
28		Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang: Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. IEEE Design & Test of Computers 20(5): 6-7 (2003)
	2002
27		Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech: Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC 2002: 1120-1129
26		Kenneth M. Butler: Is ITC Bored with Board Test? ITC 2002: 1237
25		Hari Balachandran, Kenneth M. Butler, Neil Simpson: Facilitating Rapid First Silicon Debug. ITC 2002: 628-637
	2001
24		Frank F. Hsu, Kenneth M. Butler, Janak H. Patel: A case study on the implementation of the Illinois Scan Architecture. ITC 2001: 538-547
23		Jayashree Saxena, Kenneth M. Butler, Lee Whetsel: An analysis of power reduction techniques in scan testing. ITC 2001: 670-677
22		Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang: Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Design & Test of Computers 18(1): 31-41 (2001)
	2000
21		Jayashree Saxena, Kenneth M. Butler: An empirical study on the effects of test type ordering on overall test efficiency. ITC 2000: 408-416
20		Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler: Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC 2000: 729-738
	1999
19		Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala: Expediting ramp-to-volume production. ITC 1999: 103-112
18		Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith: Correlation of logical failures to a suspect process step. ITC 1999: 458-476
17		Kenneth M. Butler: A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data. ITC 1999: 839-847
16		Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer: REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274
15		Kenneth M. Butler: Estimating the Economic Benefits of DFT. IEEE Design & Test of Computers 16(1): 71-79 (1999)
	1998
14		Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess: On applying non-classical defect models to automated diagnosis. ITC 1998: 748-757
	1997
13		Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly: So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038
12		Kenneth M. Butler: The stuck-at fault: it ain't over 'til it's over. ITC 1997: 1165
11		Kenneth M. Butler: Stuck-at fault: a fault model for the next millennium. ITC 1997: 1166
10		David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler: Bridging Fault Diagnosis in the Absence of Physical Information. ITC 1997: 887-893
9		Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken: An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459
8		Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena: Automated Diagnosis in Testing and Failure Analysis. IEEE Design & Test of Computers 14(3): 83-89 (1997)
	1996
7		Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena: Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. ITC 1996: 934
	1995
6		Graham Hetherington, Greg Sutton, Kenneth M. Butler, Theo J. Powell: Test Generation and Design for Test for a Large Multiprocessing DSP. ITC 1995: 149-156
5		Kenneth M. Butler: Deep Submicron: Is Test Up to the Challenge? ITC 1995: 923
	1991
4		Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer: Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams. DAC 1991: 417-420
3		Don E. Ross, Kenneth M. Butler, M. Ray Mercer: Exact ordered binary decision diagram size when representing classes of symmetric functions. J. Electronic Testing 2(3): 243-259 (1991)
	1990
2		Kenneth M. Butler, M. Ray Mercer: The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design. DAC 1990: 673-678
	1988
1		Rhonda Kay Gaede, Don E. Ross, M. Ray Mercer, Kenneth M. Butler: CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology. DAC 1988: 597-600

Coauthor Index

1	Nisar Ahmed	[33]
2	Robert C. Aitken (Rob Aitken)	[9] [13]
3	N. V. Arvind	[29]
4	Hari Balachandran	[14] [16] [18] [19] [20] [25]
5	Supatra Basu	[27]
6	John Berech	[27]
7	Stephanie Butler	[18]
8	David J. Campbell	[27]
9	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[28]
10	Brian Chess	[10] [14]
11	Jennifer Dworak	[16] [22]
12	F. Joel Ferguson	[10] [14]
13	Craig Force	[18] [19]
14	Tony Fryars	[30]
15	Rhonda Kay Gaede	[1]
16	Gordon Gammie	[19]
17	John Gatt	[27]
18	Michael R. Grimaila	[16] [22]
19	Manfred Hachinger	[29]
20	Graham Hetherington	[6] [30]
21	Bryan Houchins	[16]
22	Frank F. Hsu	[24]
23	Sri Jandhyala	[19]
24	Vinay B. Jayaram	[29]
25	Karl Johnson	[7] [8]
26	Anjali Jones	[7]
27	Rohit Kapur	[4]
28	Anjali Kinra	[8]
29	Sudheendra Phani Kumar	[27]
30	Subhendu Kundu	[29]
31	Fred Lakbani	[20]
32	Tracy Larrabee	[10] [14]
33	David B. Lavo	[10] [14]
34	Sooryong Lee	[16] [22]
35	Wojciech Maly	[13]
36	Vineet Mathur	[16]
37	Peter C. Maxwell	[9] [13]
38	M. Ray Mercer	[1] [2] [3] [4] [16] [22]
39	Wayne M. Needham	[9] [13]
40	Phil Nigh	[9] [13]
41	John W. Olson	[19]
42	Jaehong Park	[16]
43	Jason Parker	[18] [19]
44	Janak H. Patel	[24]
45	Jeff Platt	[7] [8]
46	Theo J. Powell	[6]
47	R. Raghuraman	[27]
48	C. P. Ravikumar	[33]
49	Don E. Ross	[1] [3] [4]
50	Jayashree Saxena	[7] [8] [10] [14] [20] [21] [23] [27] [29] [30]
51	Daniel Shupp	[18]
52	Neil Simpson	[25]
53	Jason Smith	[18]
54	Pravin Sreeprakash	[29]
55	Zoran Stanojevic	[20]
56	Bret Stewart	[16] [22]
57	Greg Sutton	[6]
58	Mohammad Tehranipoor	[33] [34]
59	D. M. H. Walker (Duncan M. Hank Walker)	[20]
60	Li-C. Wang	[16] [22] [28]
61	Lee Whetsel	[23]
62	Jason D. Wicker	[22]

Colors in the list of coauthors