| 2009 | ||
|---|---|---|
| 31 | Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Rauf Salimi Khaligh, Martin Radetzki, Hans-Joachim Wunderlich, Stefano Di Carlo, Paolo Prinetto: Test exploration and validation using transaction level models. DATE 2009: 1250-1253 | |
| 2008 | ||
| 30 | Alfredo Benso, Stefano Di Carlo, Gianfranco Politano, Luca Sterpone: Differential gene expression graphs: A data structure for classification in DNA microarrays. BIBE 2008: 1-6 | |
| 29 | Alfredo Benso, Stefano Di Carlo, Gianfranco Politano, Luca Sterpone: A graph-based representation of Gene Expression profiles in DNA microarrays. CIBCB 2008: 75-82 | |
| 28 | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: March Test Generation Revealed. IEEE Trans. Computers 57(12): 1704-1713 (2008) | |
| 27 | Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Yervant Zorian: IEEE Standard 1500 Compliance Verification for Embedded Cores. IEEE Trans. VLSI Syst. 16(4): 397-407 (2008) | |
| 2007 | ||
| 26 | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Riccardo Mariani: A Functional Verification Based Fault Injection Environment. DFT 2007: 114-122 | |
| 25 | Mohammad Hosseinabady, Mohammad Hossein Neishaburi, Zainalabedin Navabi, Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Giorgio Di Natale: Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC. IOLTS 2007: 205-206 | |
| 2006 | ||
| 24 | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Automatic march tests generations for static linked faults in SRAMs. DATE 2006: 1258-1263 | |
| 23 | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs. DDECS 2006: 157-158 | |
| 22 | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Automatic March Tests Generation for Multi-Port SRAMs. DELTA 2006: 385-392 | |
| 21 | Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto: Single-Event Upset Analysis and Protection in High Speed Circuits. European Test Symposium 2006: 29-34 | |
| 20 | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: A 22n March Test for Realistic Static Linked Faults in SRAMs. European Test Symposium 2006: 49-54 | |
| 2004 | ||
| 19 | Marie-Lise Flottes, Yves Bertrand, L. Balado, E. Lupon, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich: Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ. DELTA 2004: 135-139 | |
| 2003 | ||
| 18 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: A Watchdog Processor to Detect Data and Control Flow Errors. IOLTS 2003: 144-148 | |
| 17 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, I. Solcia, Luca Tagliaferri: FAUST: FAUlt-injection Script-based Tool. IOLTS 2003: 160 | |
| 16 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri: Data Critically Estimation In Software Applications. ITC 2003: 802-810 | |
| 15 | Yves Bertrand, Marie-Lise Flottes, L. Balado, Joan Figueras, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich, J.-P. Van der Heyden: Test Engineering Education in Europe: the EuNICE-Test Project. MSE 2003: 85-86 | |
| 14 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Online Self-Repair of FIR Filters. IEEE Design & Test of Computers 20(3): 50-57 (2003) | |
| 13 | Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Yervant Zorian: A Hierarchical Infrastructure for SoC Test Management. IEEE Design & Test of Computers 20(4): 32-39 (2003) | |
| 2002 | ||
| 12 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Specification and Design of a New Memory Fault Simulator. Asian Test Symposium 2002: 92-97 | |
| 11 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: An Optimal Algorithm for the Automatic Generation of March Tests. DATE 2002: 938-943 | |
| 10 | Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto: Automated Synthesis of SEU Tolerant Architectures from OO Descriptions. IOLTW 2002: 26-31 | |
| 9 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Static Analysis of SEU Effects on Software Applications. ITC 2002: 500-508 | |
| 2001 | ||
| 8 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Memory Read Faults: Taxonomy and Automatic Test Generation. Asian Test Symposium 2001: 157-163 | |
| 7 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri: Control-Flow Checking via Regular Expressions. Asian Test Symposium 2001: 299-303 | |
| 6 | Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto, Hans-Joachim Wunderlich: On applying the set covering model to reseeding. DATE 2001: 156-161 | |
| 5 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: SEU effect analysis in an open-source router via a distributed fault injection environment. DATE 2001: 219-225 | |
| 4 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Luca Tagliaferri, Paolo Prinetto: Validation of a Software Dependability Tool via Fault Injection Experiments. IOLTW 2001: 3-8 | |
| 2000 | ||
| 3 | Alfredo Benso, Stefano Di Carlo, Silvia Chiusano, Paolo Prinetto, Fabio Ricciato, Monica Lobetti Bodoni, Maurizio Spadari: On Integrating a Proprietary and a Commercial Architecture for Optimal BIST Performances in SoCs. ICCD 2000: 539-540 | |
| 2 | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni: A programmable BIST architecture for clusters of multiple-port SRAMs. ITC 2000: 557-566 | |
| 1 | Alfredo Benso, Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto, Fabio Ricciato, Maurizio Spadari, Yervant Zorian: HD/sup 2/BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs. ITC 2000: 892-901 | |