Wei-Ting Kary Chien

	2007
3		Wei-Ting Kary Chien, S. F. Yang: A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing. IEEE Transactions on Reliability 56(1): 69-76 (2007)
	2004
2		Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai: Some practical considerations for effective and efficient wafer-level reliability control. Microelectronics Reliability 44(8): 1233-1243 (2004)
	2003
1		Summer F. C. Tseng, Wei-Ting Kary Chien, Bing-Chu Cai: Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation. Microelectronics Reliability 43(5): 713-724 (2003)

Coauthor Index

1	Bing-Chu Cai	[1] [2]
2	Excimer Gong	[2]
3	Summer F. C. Tseng	[1] [2]
4	Willings Wang	[2]
5	S. F. Yang	[3]

Colors in the list of coauthors