Edward I. Cole Jr.

	2004
3		Edward I. Cole Jr.: Global Failure Localization: We Have To, But on What and How?. ITC 2004: 1440
	2001
2		Edward I. Cole Jr.: Global fault localization using induced voltage alteration. Microelectronics Reliability 41(8): 1145-1159 (2001)
	1997
1		Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins: Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. ITC 1997: 23-31

Coauthor Index

1	Daniel L. Barton	[1]
2	Richard W. Beegle	[1]
3	Patrick L. Candelaria	[1]
4	Charles F. Hawkins	[1]
5	Christopher L. Henderson	[1]
6	Jerry M. Soden	[1]
7	Paiboon Tangyunyong	[1]