| 2009 | ||
|---|---|---|
| 54 | Bernard Courtois, Kholdoun Torki, S. Dumont, S. Eyraud, J.-F. Paillotin, G. di Pendina: Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India. VLSI Design 2009: 561-566 | |
| 2007 | ||
| 53 | P. Szabo, B. Nemeth, Márta Rencz, Bernard Courtois: Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology CoRR abs/0711.3301: (2007) | |
| 2006 | ||
| 52 | Bernard Courtois: Session Abstract. VTS 2006: 150-151 | |
| 2005 | ||
| 51 | Bernard Courtois: Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004. Microelectronics Journal 36(7): 613 (2005) | |
| 2004 | ||
| 50 | Bernard Courtois: Infrastructures for Education, Research and Industry in Microelectronics - A review. DELTA 2004: 149-156 | |
| 49 | Salvador Mir, Libor Rufer, Bernard Courtois: On-chip testing of embedded transducers. VLSI Design 2004: 463- | |
| 2003 | ||
| 48 | Bernard Courtois: Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen. it - Information Technology 45(6): (2003) | |
| 2001 | ||
| 47 | Kholdoun Torki, Bernard Courtois: CMP: The Access to Advanced Low Costy Manufacturing. MSE 2001: 6- | |
| 46 | Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217 | |
| 45 | Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electronic Testing 17(6): 459-470 (2001) | |
| 2000 | ||
| 44 | Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz: Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33 | |
| 43 | Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois: Design of self-checking fully differential circuits and boards. IEEE Trans. VLSI Syst. 8(2): 113-128 (2000) | |
| 42 | Salvador Mir, Benoît Charlot, Bernard Courtois: Extending Fault-Based Testing to Microelectromechanical Systems. J. Electronic Testing 16(3): 279-288 (2000) | |
| 41 | Márta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois: IDDQ Testing of Submicron CMOS - by Cooling? J. Electronic Testing 16(5): 453-461 (2000) | |
| 1999 | ||
| 40 | Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328 | |
| 39 | Kholdoun Torki, Bernard Courtois: Advanced Low Cost Manufacturing From CMP Service. MSE 1999: 4-5 | |
| 38 | Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270- | |
| 37 | Bernard Courtois, R. D. (Shawn) Blanton: Guest Editors' Introduction. IEEE Design & Test of Computers 16(4): 16-17 (1999) | |
| 1998 | ||
| 36 | Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois: Microsystems Testing: an Approach and Open Problems. DATE 1998: 524- | |
| 35 | S. J. Abou-Samra, P. A. Aisa, Alain Guyot, Bernard Courtois: 3D CMOS SOL for high performance computing. ISLPED 1998: 54-58 | |
| 34 | A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois: Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550 | |
| 33 | Vladimir Székely, Márta Rencz, Bernard Courtois: Tracing the Thermal Behavior of ICs. IEEE Design & Test of Computers 15(2): 14-21 (1998) | |
| 32 | Marcelo Lubaszewski, Bernard Courtois: A Reliable Fail-Safe System. IEEE Trans. Computers 47(2): 236-241 (1998) | |
| 31 | Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring of Self-Checking Systems. J. Electronic Testing 12(1-2): 81-92 (1998) | |
| 1997 | ||
| 30 | Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: CAD and Foundries for Microsystems. DAC 1997: 674-679 | |
| 29 | Klaus Hofmann, Manfred Glesner, Nicu Sebe, A. Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois: Generation of the HDL-A-model of a micromembrane from its finite-element-description. ED&TC 1997: 108-112 | |
| 28 | Vladimir Székely, Márta Rencz, Bernard Courtois: Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS 1997: 440-445 | |
| 27 | Jean-Michel Karam, Bernard Courtois, Hicham Boutamine: CAD Tools for Bridging Microsystems and Foundries. IEEE Design & Test of Computers 14(2): 34-39 (1997) | |
| 1996 | ||
| 26 | Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288 | |
| 25 | Bozena Kaminska, Bernard Courtois: Guest Editors' Introduction: Mixed Analog and Digital Systems. IEEE Design & Test of Computers 13(2): 8-9 (1996) | |
| 24 | Bernard Courtois: Second Therminic Workshop. IEEE Design & Test of Computers 13(4): 5- (1996) | |
| 23 | Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Unified built-in self-test for fully differential analog circuits. J. Electronic Testing 9(1-2): 135-151 (1996) | |
| 22 | Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electronic Testing 9(1-2): 43-57 (1996) | |
| 21 | Bozena Kaminska, Bernard Courtois: Guest editorial. J. Electronic Testing 9(1-2): 7-8 (1996) | |
| 1995 | ||
| 20 | Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri: Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189- | |
| 19 | Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski: Frequency-based BIST for analog circuit testin. VTS 1995: 54-59 | |
| 18 | Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois: Conference Reports. IEEE Design & Test of Computers 12(4): 95-97 (1995) | |
| 17 | Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois: Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995) | |
| 16 | Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Analog checkers with absolute and relative tolerances. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995) | |
| 1994 | ||
| 15 | Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois: Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490 | |
| 1993 | ||
| 14 | F. L. Vargas, Michael Nicolaidis, Bernard Courtois: Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. ICCD 1993: 596-600 | |
| 1992 | ||
| 13 | Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski: Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC 1992: 120-129 | |
| 12 | Marcelo Lubaszewski, Bernard Courtois: On the Design of Self-Checking Boundary Scannable Boards. ITC 1992: 372-381 | |
| 1991 | ||
| 11 | Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois: Built-In Self-Test for Multi-Port RAMs. ICCAD 1991: 248-251 | |
| 10 | M. Marzouki, J. Laurent, Bernard Courtois: Coupling Electron-Beam Probing with Knowledge-Based Fault Localization. ITC 1991: 238-247 | |
| 1990 | ||
| 9 | P. Bondono, Ahmed Amine Jerraya, A. Hornik, Bernard Courtois, D. Bonifas: NAUTILE: a safe environment for silicon compilation. EURO-DAC 1990: 605-609 | |
| 1989 | ||
| 8 | René David, Antoine Fuentes, Bernard Courtois: Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989) | |
| 1988 | ||
| 7 | Jean Paul Caisso, Bernard Courtois: Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. ITC 1988: 94-101 | |
| 6 | Ingrid Jansch, Bernard Courtois: Definition and Design of Strongly Language Disjoint Checkers. IEEE Trans. Computers 37(6): 745-748 (1988) | |
| 5 | Michael Nicolaidis, Bernard Courtois: Strongly Code Disjoint Checkers. IEEE Trans. Computers 37(6): 751-756 (1988) | |
| 1986 | ||
| 4 | Ahmed Amine Jerraya, P. Varinot, R. Jamier, Bernard Courtois: Principles of the SYCO compiler. DAC 1986: 715-721 | |
| 3 | J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin: Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. ITC 1986: 465-473 | |
| 1984 | ||
| 2 | H. Sahami, Bernard Courtois: Functional testing vs. structural testing of RAMs. Fehlertolerierende Rechensysteme 1984: 391-403 | |
| 1981 | ||
| 1 | Bernard Courtois: Analytical Testing of Data Processing Sections of Integrated CPUs. ITC 1981: 21-30 | |