Bernard Courtois

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2007
44EEP. Szabo, B. Nemeth, Márta Rencz, Bernard Courtois: Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology CoRR abs/0711.3301: (2007)
2006
43EEBernard Courtois: Session Abstract. VTS 2006: 150-151
2005
42EEBernard Courtois: Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004. Microelectronics Journal 36(7): 613 (2005)
2004
41EEBernard Courtois: Infrastructures for Education, Research and Industry in Microelectronics - A review. DELTA 2004: 149-156
40EESalvador Mir, Libor Rufer, Bernard Courtois: On-chip testing of embedded transducers. VLSI Design 2004: 463-
2003
39EEBernard Courtois: Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen. it - Information Technology 45(6): (2003)
2001
38EEKholdoun Torki, Bernard Courtois: CMP: The Access to Advanced Low Costy Manufacturing. MSE 2001: 6-
37EEBenoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217
2000
36EESalvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz: Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33
35EEMarcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois: Design of self-checking fully differential circuits and boards. IEEE Trans. VLSI Syst. 8(2): 113-128 (2000)
1999
34 Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328
33EEKholdoun Torki, Bernard Courtois: Advanced Low Cost Manufacturing From CMP Service. MSE 1999: 4-5
32 Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-
31 Bernard Courtois, R. D. (Shawn) Blanton: Guest Editors' Introduction. IEEE Design & Test of Computers 16(4): 16-17 (1999)
1998
30EEMarcelo Lubaszewski, Érika F. Cota, Bernard Courtois: Microsystems Testing: an Approach and Open Problems. DATE 1998: 524-
29EES. J. Abou-Samra, P. A. Aisa, Alain Guyot, Bernard Courtois: 3D CMOS SOL for high performance computing. ISLPED 1998: 54-58
28EEA. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois: Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550
27EEVladimir Székely, Márta Rencz, Bernard Courtois: Tracing the Thermal Behavior of ICs. IEEE Design & Test of Computers 15(2): 14-21 (1998)
26 Marcelo Lubaszewski, Bernard Courtois: A Reliable Fail-Safe System. IEEE Trans. Computers 47(2): 236-241 (1998)
1997
25EEJean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: CAD and Foundries for Microsystems. DAC 1997: 674-679
24EEVladimir Székely, Márta Rencz, Bernard Courtois: Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS 1997: 440-445
23EEJean-Michel Karam, Bernard Courtois, Hicham Boutamine: CAD Tools for Bridging Microsystems and Foundries. IEEE Design & Test of Computers 14(2): 34-39 (1997)
1996
22EEVladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288
21 Bozena Kaminska, Bernard Courtois: Guest Editors' Introduction: Mixed Analog and Digital Systems. IEEE Design & Test of Computers 13(2): 8-9 (1996)
20 Bernard Courtois: Second Therminic Workshop. IEEE Design & Test of Computers 13(4): 5- (1996)
1995
19EEVishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri: Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189-
18EEKhaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski: Frequency-based BIST for analog circuit testin. VTS 1995: 54-59
17 Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois: Conference Reports. IEEE Design & Test of Computers 12(4): 95-97 (1995)
16 Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois: Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995)
15EEVladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Analog checkers with absolute and relative tolerances. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995)
1994
14EESalvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois: Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490
1993
13 F. L. Vargas, Michael Nicolaidis, Bernard Courtois: Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. ICCD 1993: 596-600
1992
12 Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski: Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC 1992: 120-129
11 Marcelo Lubaszewski, Bernard Courtois: On the Design of Self-Checking Boundary Scannable Boards. ITC 1992: 372-381
1991
10 Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois: Built-In Self-Test for Multi-Port RAMs. ICCAD 1991: 248-251
9 M. Marzouki, J. Laurent, Bernard Courtois: Coupling Electron-Beam Probing with Knowledge-Based Fault Localization. ITC 1991: 238-247
1989
8 René David, Antoine Fuentes, Bernard Courtois: Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989)
1988
7 Jean Paul Caisso, Bernard Courtois: Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. ITC 1988: 94-101
6 Ingrid Jansch, Bernard Courtois: Definition and Design of Strongly Language Disjoint Checkers. IEEE Trans. Computers 37(6): 745-748 (1988)
5 Michael Nicolaidis, Bernard Courtois: Strongly Code Disjoint Checkers. IEEE Trans. Computers 37(6): 751-756 (1988)
1986
4EEAhmed Amine Jerraya, P. Varinot, R. Jamier, Bernard Courtois: Principles of the SYCO compiler. DAC 1986: 715-721
3 J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin: Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. ITC 1986: 465-473
1984
2 H. Sahami, Bernard Courtois: Functional testing vs. structural testing of RAMs. Fehlertolerierende Rechensysteme 1984: 391-403
1981
1 Bernard Courtois: Analytical Testing of Data Processing Sections of Integrated CPUs. ITC 1981: 21-30

Coauthor Index

1S. J. Abou-Samra [29]
2Vishwani D. Agrawal [19]
3P. A. Aisa [29]
4Vladimir Castro Alves [10]
5L. Bergher [3]
6R. D. (Shawn) Blanton (Ronald D. Blanton) [31]
7Hicham Boutamine [23] [25]
8Jean Paul Caisso [7]
9A. Castillejo [28]
10Sreejit Chakravarty [17]
11Benoît Charlot [34] [36] [37]
12P. Pal Chaudhuri [19]
13Jacques P. Collin [3]
14Philippe Coste [36]
15Érika F. Cota [30] [34]
16René David [8]
17P. Drake [25]
18Antoine Fuentes [8]
19Manfred Glesner [25] [32]
20Alain Guyot [29]
21Sybille Hellebrand [12] [16]
22Fumiyasu Hirose [19]
23Klaus Hofmann [25] [32]
24R. Jamier [4]
25Ingrid Jansch [6]
26Ahmed Amine Jerraya [4] [36]
27Bozena Kaminska [17] [18] [21]
28Jean-Michel Karam [22] [23] [25] [28] [32]
29Vladimir Kolarik [14] [15] [35]
30Sandip Kundu [19]
31J. Laurent [3] [9]
32Chung-Len Lee [19]
33P. Lestrat [10]
34Marcelo Lubaszewski [11] [14] [15] [18] [22] [26] [30] [32] [34] [35]
35M. Marzouki [9]
36Yinghua Min [19]
37Salvador Mir [14] [15] [28] [32] [34] [35] [36] [37] [40]
38B. Nemeth [44]
39Michael Nicolaidis [5] [10] [13]
40Gabriela Nicolescu [36]
41C. Nielsen [14] [35]
42Fabien Parrain [36] [37]
43Gil Philips [17]
44András Poppe [25]
45Janusz Rajski [12] [16]
46Márta Rencz [22] [24] [25] [27] [32] [36] [44]
47Libor Rufer [40]
48Khaled Saab [18]
49H. Sahami [2]
50Ramalingam Sridhar [17]
51P. Szabo [44]
52Vladimir Székely [22] [24] [25] [27] [32]
53Steffen Tarnick [12] [16]
54Kholdoun Torki [33] [38]
55Shambhu J. Upadhyaya [17]
56F. L. Vargas [13]
57P. Varinot [4]
58Srikanth Venkataraman [16]
59D. Veychard [28]
60Nacer-Eddine Zergainoh [36]
61Yervant Zorian [17]

Colors in the list of coauthors

Copyright © Fri Oct 3 18:41:27 2008 by Michael Ley (ley@uni-trier.de)