Y. Danto

	2006
17		C. Bestory, F. Marc, H. Levi, Y. Danto: Multi-level Modeling of Hot Carrier Injection for Reliability. FDL 2006: 61-68
16		W. C. Maia Filho, M. Brizoux, H. Frémont, Y. Danto: Improved physical understanding of intermittent failure in continuous monitoring method. Microelectronics Reliability 46(9-11): 1886-1891 (2006)
	2005
15		S. Huyghe, L. Béchou, N. Zerounian, Y. Deshayes, F. Aniel, A. Denolle, D. Laffitte, J. L. Goudard, Y. Danto: Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. Microelectronics Reliability 45(9-11): 1593-1599 (2005)
14		A. Dehbi, Y. Ousten, Y. Danto, W. Wondrak: Vibration lifetime modelling of PCB assemblies using steinberg model. Microelectronics Reliability 45(9-11): 1658-1661 (2005)
	2003
13		F. Marc, B. Mongellaz, Y. Danto: Reliability simulation of electronic circuits with VHDL-AMS. FDL 2003: 175-184
12		T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto: A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability 43(1): 173-177 (2003)
11		Y. Deshayes, L. Béchou, J.-Y. Delétage, F. Verdier, Y. Danto, D. Laffitte, J. L. Goudard: Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectronics Reliability 43(7): 1125-1136 (2003)
10		J.-Y. Delétage, F. J.-M. Verdier, B. Plano, Y. Deshayes, L. Béchou, Y. Danto: Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectronics Reliability 43(7): 1137-1144 (2003)
9		B. Mongellaz, F. Marc, Y. Danto: Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study. Microelectronics Reliability 43(9-11): 1513-1518 (2003)
8		L. Mendizabal, Jean-Louis Verneuil, L. Béchou, Christelle Aupetit-Berthelemot, Y. Deshayes, F. Verdier, Jean-Michel Dumas, Y. Danto, D. Laffitte, J. L. Goudard: Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. Microelectronics Reliability 43(9-11): 1743-1749 (2003)
7		G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J. M. Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys: Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectronics Reliability 43(9-11): 1803-1807 (2003)
6		A. Tetelin, C. Pellet, J.-Y. Delétage, B. Carbonne, Y. Danto: Moisture diffusion in BCB resins used for MEMS packaging. Microelectronics Reliability 43(9-11): 1939-1944 (2003)
	2002
5		A. Dehbi, W. Wondrak, Y. Ousten, Y. Danto: High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectronics Reliability 42(6): 835-840 (2002)
4		B. Trégon, Y. Ousten, Y. Danto, L. Béchou, B. Parmentier: Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectronics Reliability 42(7): 1113-1120 (2002)
3		B. Mongellaz, F. Marc, N. Milet-Lewis, Y. Danto: Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language. Microelectronics Reliability 42(9-11): 1353-1358 (2002)
2		J. Augereau, Y. Ousten, L. Béchou, Y. Danto: Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). Microelectronics Reliability 42(9-11): 1517-1522 (2002)
1		G. Duchamp, Y. Ousten, Y. Danto: Evaluation of a micropackaging analysis technique by highfrequency microwaves. Microelectronics Reliability 42(9-11): 1551-1554 (2002)

Coauthor Index

1	G. Andriamonje	[7]
2	F. Aniel	[15]
3	J. Augereau	[2]
4	Christelle Aupetit-Berthelemot	[8]
5	T. Beauchêne	[12]
6	Felix Beaudoin	[12]
7	L. Béchou	[2] [4] [8] [10] [11] [15]
8	C. Bestory	[17]
9	M. Brizoux	[16]
10	B. Carbonne	[6]
11	Wilfrid Claeys	[7]
12	A. Dehbi	[5] [14]
13	J.-Y. Delétage	[6] [10] [11]
14	A. Denolle	[15]
15	Y. Deshayes	[8] [10] [11] [15]
16	Stefan Dilhaire	[7]
17	G. Duchamp	[1]
18	Jean-Michel Dumas	[8]
19	Y. Ezzahri	[7]
20	W. C. Maia Filho	[16]
21	Pascal Fouillat	[12]
22	H. Frémont	[16]
23	J. L. Goudard	[8] [11] [15]
24	Stéphane Grauby	[7]
25	S. Huyghe	[15]
26	D. Laffitte	[8] [11] [15]
27	H. Levi	[17]
28	D. Lewis	[7] [12]
29	F. Marc	[3] [9] [13] [17]
30	L. Mendizabal	[8]
31	N. Milet-Lewis	[3]
32	B. Mongellaz	[3] [9] [13]
33	Y. Ousten	[1] [2] [4] [5] [7] [14]
34	B. Parmentier	[4]
35	C. Pellet	[6]
36	Philippe Perdu	[12]
37	B. Plano	[10]
38	V. Pouget	[7] [12]
39	J. M. Rampnoux	[7]
40	A. Tetelin	[6]
41	B. Trégon	[4]
42	F. Verdier	[8] [11]
43	F. J.-M. Verdier	[10]
44	Jean-Louis Verneuil	[8]
45	W. Wondrak	[5] [14]
46	N. Zerounian	[15]

Colors in the list of coauthors