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11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Date, Tokuro Matsuo: Effects of At-Home Nursing Service Scheduling in Multiagent Systems. New Challenges in Applied Intelligence Technologies 2008: 245-254
2003
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLToshinori Hosokawa, Hiroshi Date, Masahide Miyazaki, Michiaki Muraoka, Hideo Fujiwara: A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint. Asian Test Symposium 2003: 130-135
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMasahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara: A DFT Selection Method for Reducing Test Application Time of System-on-Chips. Asian Test Symposium 2003: 412-417
2002
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Date, Toshinori Hosokawa, Michiaki Muraoka: A SoC Test Strategy Based on a Non-Scan DFT Method. Asian Test Symposium 2002: 305-310
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLToshinori Hosokawa, Hiroshi Date, Michiaki Muraoka: A State Reduction Method for Non-Scan Based FSM Testing with Don't Care Inputs Identification Technique. Asian Test Symposium 2002: 55-60
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLToshinori Hosokawa, Hiroshi Date, Michiaki Muraoka: A Test Generation Method Using a Compacted Test Table and a Test Generation Method Using a Compacted Test Plan Table for RTL Data Path Circuits. VTS 2002: 328-335
2000
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMakoto Sugihara, Hiroto Yasuura, Hiroshi Date: Analysis and Minimization of Test Time in a Combined BIST and External Test Approach. DATE 2000: 134-140
4no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Date, Vikram Iyengar, Krishnendu Chakrabarty, Makoto Sugihara: Mathematical Modeling of Intellectual Property Protection Using Partially-Mergeable Cores. PDPTA 2000
1998
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMakoto Sugihara, Hiroshi Date, Hiroto Yasuura: A novel test methodology for core-based system LSIs and a testing time minimization problem. ITC 1998: 465-
1995
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Date, Michinobu Nakao, Kazumi Hatayama: A parallel sequential test generation system DESCARTES based on real-valued logic simulation. Asian Test Symposium 1995: 252-258
1992
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Date, Yukinori Matsumoto, Kouichi Kimura, Kazuo Taki, Hiroo Kato, Masahiro Hoshi: LSI-CAD Programs on Parallel Inference Machine. FGCS 1992: 237-247

Coauthor Index

1Krishnendu Chakrabarty [4]
2Hideo Fujiwara [9] [10]
3Kazumi Hatayama [2]
4Masahiro Hoshi [1]
5Toshinori Hosokawa [6] [7] [8] [9] [10]
6Vikram Iyengar [4]
7Hiroo Kato [1]
8Kouichi Kimura [1]
9Yukinori Matsumoto [1]
10Tokuro Matsuo [11]
11Masahide Miyazaki [9] [10]
12Michiaki Muraoka [6] [7] [8] [9] [10]
13Michinobu Nakao [2]
14Makoto Sugihara [3] [4] [5]
15Kazuo Taki [1]
16Hiroto Yasuura [3] [5]

Colors in the list of coauthors

Copyright © Tue Dec 1 12:01:14 2009 by Michael Ley (ley@uni-trier.de)