Rene David

	1996
3		S. Crepaux-Motte, Mireille Jacomino, Rene David: An algebraic method for delay fault testing. VTS 1996: 308-315
	1990
2		Rene David, S. Rahal, J. L. Rainard: Some relationships between delay testing and stuck-open testing in CMOS circuits. EURO-DAC 1990: 339-343
	1987
1		Mireille Jacomino, J. L. Rainard, Rene David: Fault Detection By Consumption Measurement in CMOS Circuits. Fehlertolerierende Rechensysteme 1987: 83-94

Coauthor Index

1	S. Crepaux-Motte	[3]
2	Mireille Jacomino	[1] [3]
3	S. Rahal	[2]
4	J. L. Rainard	[1] [2]