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DBLP keys2006
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. Thijs, M. Natarajan Iyer, D. Linten, Wutthinan Jeamsaksiri, T. Daenen, Robin Degraeve, Andries Scholten, Stefaan Decoutere, Guido Groeseneken: Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions. Microelectronics Reliability 46(5-6): 702-712 (2006)
2005
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJ. Pétry, Wilfried Vandervorst, L. Pantisano, Robin Degraeve: On the data interpretation of the C-AFM measurements in the characterization of thin insulating layers. Microelectronics Reliability 45(5-6): 815-818 (2005)
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRobert O'Connor, Greg Hughes, Robin Degraeve, Ben Kaczer: Progressive breakdown in ultrathin SiON dielectrics and its effect on transistor performance. Microelectronics Reliability 45(5-6): 869-874 (2005)
2003
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen: A new method for the analysis of high-resolution SILC data. Microelectronics Reliability 43(9-11): 1483-1488 (2003)
2002
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBen Kaczer, Robin Degraeve, M. Rasras, A. De Keersgieter, K. Van de Mieroop, Guido Groeseneken: Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study. Microelectronics Reliability 42(4-5): 555-564 (2002)
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. Aresu, Ward De Ceuninck, R. Dreesen, K. Croes, E. Andries, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger: High-resolution SILC measurements of thin SiO2 at ultra low voltages. Microelectronics Reliability 42(9-11): 1485-1489 (2002)
1999
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMarc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke: Cost-effective cleaning and high-quality thin gate oxides. IBM Journal of Research and Development 43(3): 339-350 (1999)

Coauthor Index

1E. Andries [2]
2S. Aresu [2] [4]
3Twan Bearda [1]
4Ward De Ceuninck [2] [4]
5Ingrid Cornelissen [1]
6K. Croes [2]
7Jan D'Haen [4]
8Marc D'Olieslaeger [2] [4]
9T. Daenen [7]
10Stefaan Decoutere [7]
11R. Dreesen [2]
12Stefan De Gendt [1]
13Guido Groeseneken [1] [3] [7]
14Marc M. Heyns [1]
15Greg Hughes [5]
16M. Natarajan Iyer [7]
17Wutthinan Jeamsaksiri [7]
18Ben Kaczer [2] [3] [4] [5]
19A. De Keersgieter [3]
20Conny Kenens [1]
21D. Martin Knotter [1]
22G. Knuyt [4]
23D. Linten [7]
24Lee M. Loewenstein [1]
25J. Manca [2] [4]
26J. Mertens [4]
27Paul W. Mertens [1]
28Sofie Mertens [1]
29Marc Meuris [1]
30K. Van de Mieroop [3]
31Tanya Nigam [1]
32Robert O'Connor [5]
33L. Pantisano [6]
34J. Pétry [6]
35M. Rasras [3]
36Marc Schaekers [1]
37Luc De Schepper [2] [4]
38Andries Scholten [7]
39Ivo Teerlinck [1]
40S. Thijs [7]
41Wilfried Vandervorst [1] [6]
42Rita Vos [1]
43Klaus Wolke [1]

Copyright © Thu Dec 3 22:36:56 2009 by Michael Ley (ley@uni-trier.de)