Stefan Dilhaire

	2006
12		J. M. Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire: Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectronics Reliability 46(9-11): 1520-1524 (2006)
	2005
11		Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire: ElectroStatic Discharge Fault Localization by Laser Probing. Microelectronics Reliability 45(9-11): 1482-1486 (2005)
	2004
10		Josep Altet, Antonio Rubio, M. Amine Salhi, J. L. Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov: Sensing temperature in CMOS circuits for Thermal Testing. VTS 2004: 179-184
9		Stefan Dilhaire, Stéphane Grauby, S. Jorez, Wilfrid Claeys: Strain energy imaging of a power MOS transistor using speckle interferometry. IEEE Transactions on Reliability 53(2): 293-296 (2004)
8		Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz: Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectronics Journal 35(10): 797-803 (2004)
7		Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale: Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. Microelectronics Journal 35(10): 811-816 (2004)
6		Josep Altet, J. M. Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby: Applications of temperature phase measurements to IC testing. Microelectronics Reliability 44(1): 95-103 (2004)
	2003
5		Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys: Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectronics Reliability 43(9-11): 1609-1613 (2003)
4		G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J. M. Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys: Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectronics Reliability 43(9-11): 1803-1807 (2003)
3		Guillaume Marinier, Stefan Dilhaire, Luis David Patiño Lopez, Mohamed Benzohra: Determination of passive SiO2-Au microstructure resonant frequencies. Microelectronics Reliability 43(9-11): 1951-1955 (2003)
	2000
2		Josep Altet, Antonio Rubio, E. Schaub, Stefan Dilhaire, Wilfrid Claeys: Thermal Testing: Fault Location Strategies. VTS 2000: 189-194
	1999
1		Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, E. Schaub, Hideo Tamamoto: Differential Thermal Testing: An Approach to its Feasibility. J. Electronic Testing 14(1-2): 57-66 (1999)

Coauthor Index

1	Josep Altet	[1] [2] [6] [10]
2	G. Andriamonje	[4]
3	Jean-Christophe Batsale	[6] [7]
4	Mohamed Benzohra	[3]
5	Wilfrid Claeys	[1] [2] [4] [5] [6] [7] [8] [9] [11] [12]
6	Y. Danto	[4]
7	Y. Ezzahri	[4]
8	J. L. Gálvez	[10]
9	Stéphane Grauby	[4] [5] [6] [7] [8] [9] [11] [12]
10	André Ivanov	[10]
11	S. Jorez	[9]
12	Stéphane Lefèvre	[8]
13	D. Lewis	[4]
14	Luis David Patiño Lopez	[3] [8]
15	Guillaume Marinier	[3]
16	H. Michel	[12]
17	Y. Ousten	[4]
18	V. Pouget	[4]
19	J. M. Rampnoux	[4] [6] [12]
20	Antonio Rubio	[1] [2] [6] [10]
21	M. Amine Salhi	[5] [8] [10] [11] [12]
22	E. Schaub	[1] [2]
23	Ashish Syal	[10]
24	Hideo Tamamoto	[1]
25	D. Trias	[11]
26	Sebastian Volz	[8]