Luigi Dilillo

	2009
15		Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: A new design-for-test technique for SRAM core-cell stability faults. DATE 2009: 1344-1348
14		Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Laroussi Bouzaida, Isabelle Izaute: Comprehensive bridging fault diagnosis based on the SLAT paradigm. DDECS 2009: 264-269
	2007
13		Luigi Dilillo, Bashir M. Al-Hashimi: March CRF: an Efficient Test for Complex Read Faults in SRAM Memories. DDECS 2007: 173-178
12		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electronic Testing 23(5): 435-444 (2007)
	2006
11		Luigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard: Minimizing test power in SRAM through reduction of pre-charge activity. DATE 2006: 1159-1164
10		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS 2006: 256-261
9		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J. Electronic Testing 22(3): 287-296 (2006)
8		Luigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard: Reducing Power Dissipation in SRAM during Test. J. Low Power Electronics 2(2): 271-280 (2006)
	2005
7		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862
6		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan: Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. VTS 2005: 183-188
5		Simone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electronic Testing 21(2): 169-179 (2005)
4		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electronic Testing 21(5): 551-561 (2005)
	2004
3		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium 2004: 266-271
2		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: March iC-: An Improved Version of March C- for ADOFs Detection. VTS 2004: 129-138
	2003
1		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. Asian Test Symposium 2003: 250-255

Coauthor Index

1	Bashir M. Al-Hashimi	[8] [11] [13]
2	Magali Bastian	[7] [10] [12] [15]
3	Youssef Benabboud	[14]
4	Simone Borri	[1] [2] [3] [4] [5] [9]
5	Alberto Bosio	[14]
6	Laroussi Bouzaida	[14]
7	Patrick Girard	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [14] [15]
8	Vincent Gouin	[15]
9	Magali Bastian Hage-Hassan	[3] [4] [5] [6] [9]
10	Isabelle Izaute	[14]
11	Alexandre Ney	[15]
12	Serge Pravossoudovitch	[1] [2] [3] [4] [5] [6] [7] [9] [10] [12] [14] [15]
13	Paul M. Rosinger	[8] [11]
14	Arnaud Virazel	[1] [2] [3] [4] [5] [6] [7] [9] [10] [12] [14] [15]