 | 2005 |
| 43 |  | Ashish Srivastava,
Saumil Shah,
Kanak Agarwal,
Dennis Sylvester,
David Blaauw,
Stephen W. Director:
Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance.
DAC 2005: 535-540 |
| 2001 |
| 42 |  | Juan Antonio Carballo,
Stephen W. Director:
Application of Constraint-Based Heuristics in Collaborative Design.
DAC 2001: 395-400 |
| 2000 |
| 41 |  | Jingyan Zuo,
Stephen W. Director:
An Integrated Design Environment for Early Stage Conceptual Design.
DATE 2000: 754 |
| 1999 |
| 40 |  | Juan Antonio Carballo,
Stephen W. Director:
Constraint Management for Collaborative Electronic Design.
DAC 1999: 529-534 |
| 1998 |
| 39 |  | Peter R. Sutton,
Stephen W. Director:
Framework Encapsulations: A New Approach to CAD Tool Interoperability.
DAC 1998: 134-139 |
| 1996 |
| 38 |  | Peter R. Sutton,
Stephen W. Director:
A Description Language for Design Process Management.
DAC 1996: 175-180 |
| 37 |  | John W. Hagerman,
Stephen W. Director:
Improved Tool and Data Selection in Task Management.
DAC 1996: 181-184 |
| 36 |  | Margarida F. Jacome,
Stephen W. Director:
A formal basis for design process planning and management.
IEEE Trans. on CAD of Integrated Circuits and Systems 15(10): 1197-1210 (1996) |
| 1995 |
| 35 |  | Kannan Krishna,
Stephen W. Director:
A novel methodology for statistical parameter extraction.
ICCAD 1995: 696-699 |
| 34 |  | Jay B. Brockman,
Stephen W. Director:
The schema-based approach to workflow management.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(10): 1257-1267 (1995) |
| 33 |  | Kannan Krishna,
Stephen W. Director:
The linearized performance penalty (LPP) method for optimization of parametric yield and its reliability.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(12): 1557-1568 (1995) |
| 1994 |
| 32 |  | Vladimir Koval,
Igor W. Farmaga,
Andrzej J. Strojwas,
Stephen W. Director:
MONSTR: A Complete Thermal Simulator of Electronic Systems.
DAC 1994: 570-575 |
| 31 |  | Zhihua Wang,
Stephen W. Director:
An Efficient Yield Optimization Method Using A Two Step Linear Approximation of Circuit Performance.
EDAC-ETC-EUROASIC 1994: 567-571 |
| 30 |  | Margarida F. Jacome,
Stephen W. Director:
A formal basis for design process planning and management.
ICCAD 1994: 516-521 |
| 1993 |
| 29 |  | Peter R. Sutton,
Jay B. Brockman,
Stephen W. Director:
Design Management Using Dynamically Defined Flows.
DAC 1993: 648-653 |
| 28 |  | Peter Feldmann,
Stephen W. Director:
Integrated circuit quality optimization using surface integrals.
IEEE Trans. on CAD of Integrated Circuits and Systems 12(12): 1868-1879 (1993) |
| 1992 |
| 27 |  | Margarida F. Jacome,
Stephen W. Director:
Design Process Management for CAD Frameworks.
DAC 1992: 500-505 |
| 26 |  | Jay B. Brockman,
Stephen W. Director:
A Schema-Based Approach to CAD Task Management.
Electronic Design Automation Frameworks 1992: 71-84 |
| 25 |  | Stephen W. Director,
Jonathan Allen,
J. Duley:
Engineering education: trends and needs (panel).
ICCAD 1992: 456 |
| 1991 |
| 24 |  | Peter Feldmann,
Stephen W. Director:
Improved Methods for IC Yield and Quality Optimization Using Surface Integrals.
ICCAD 1991: 158-161 |
| 23 |  | Jay B. Brockman,
Stephen W. Director:
The Hercules CAD Task Management System.
ICCAD 1991: 254-257 |
| 22 |  | Peter Feldmann,
Tuyen V. Nguyen,
Stephen W. Director,
Ronald A. Rohrer:
Sensitivity computation in piecewise approximate circuit simulation.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(2): 171-183 (1991) |
| 21 |  | James Daniell,
Stephen W. Director:
An object oriented approach to CAD tool control [VLSI].
IEEE Trans. on CAD of Integrated Circuits and Systems 10(6): 698-713 (1991) |
| 20 |  | K. K. Low,
Stephen W. Director:
A new methodology for the design centering of IC fabrication processes.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(7): 895-903 (1991) |
| 19 |  | Andrzej J. Strojwas,
Stephen W. Director:
An efficient algorithm for parametric fault simulation of monolithic IC's.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(8): 1049-1058 (1991) |
| 1990 |
| 18 |  | Peter Feldmann,
Stephen W. Director:
Accurate and Efficient Evaluation of Circuit Yield and Yield Gradients.
ICCAD 1990: 120-123 |
| 1989 |
| 17 |  | M. T. Trick,
Stephen W. Director:
LASSIE: Structure to Layout for Behavioral Synthesis Tools.
DAC 1989: 104-109 |
| 16 |  | James Daniell,
Stephen W. Director:
An Object Oriented Approach to CAD Tool Control within a Design Framework.
DAC 1989: 197-202 |
| 15 |  | K. K. Low,
Stephen W. Director:
An efficient methodology for building macromodels of IC fabrication processes.
IEEE Trans. on CAD of Integrated Circuits and Systems 8(12): 1299-1313 (1989) |
| 14 |  | Michael L. Bushnell,
Stephen W. Director:
Automated design tool execution in the Ulysses design environment.
IEEE Trans. on CAD of Integrated Circuits and Systems 8(3): 279-287 (1989) |
| 1987 |
| 13 |  | Michael L. Bushnell,
Stephen W. Director:
ULYSSES - a knowledge-based VLSI design environment.
AI in Engineering 2(1): 33-41 (1987) |
| 1986 |
| 12 |  | Luís M. Vidigal,
Sani R. Nassif,
Stephen W. Director:
CINNAMON: coupled integration and nodal analysis of MOS networks.
DAC 1986: 179-185 |
| 11 |  | Michael L. Bushnell,
Stephen W. Director:
VLSI CAD tool integration using the Ulysses environment.
DAC 1986: 55-61 |
| 10 |  | Sani R. Nassif,
Andrzej J. Strojwas,
Stephen W. Director:
A Methodology for Worst-Case Analysis of Integrated Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 5(1): 104-113 (1986) |
| 9 |  | Wojciech Maly,
Andrzej J. Strojwas,
Stephen W. Director:
VLSI Yield Prediction and Estimation: A Unified Framework.
IEEE Trans. on CAD of Integrated Circuits and Systems 5(1): 114-130 (1986) |
| 8 |  | Costas J. Spanos,
Stephen W. Director:
Parameter Extraction for Statistical IC Process Characterization.
IEEE Trans. on CAD of Integrated Circuits and Systems 5(1): 66-78 (1986) |
| 7 |  | David P. La Potin,
Stephen W. Director:
Mason: A Global Floorplanning Approach for VLSI Design.
IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 477-489 (1986) |
| 6 |  | D. M. H. Walker,
Stephen W. Director:
VLASIC: A Catastrophic Fault Yield Simulator for Integrated Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 541-556 (1986) |
| 1985 |
| 5 |  | Tariq Samad,
Stephen W. Director:
Towards a natural language interface for CAD.
DAC 1985: 2-8 |
| 4 |  | Andrzej J. Strojwas,
Stephen W. Director:
A Pattern Recognition Based Method for IC Failure Analysis.
IEEE Trans. on CAD of Integrated Circuits and Systems 4(1): 76-92 (1985) |
| 3 |  | Karem A. Sakallah,
Stephen W. Director:
SAMSON2: An Event Driven VLSI Circuit Simulator.
IEEE Trans. on CAD of Integrated Circuits and Systems 4(4): 668-684 (1985) |
| 1984 |
| 2 |  | Sani R. Nassif,
Andrzej J. Strojwas,
Stephen W. Director:
FABRICS II: A Statistically Based IC Fabrication Process Simulator.
IEEE Trans. on CAD of Integrated Circuits and Systems 3(1): 40-46 (1984) |
| 1982 |
| 1 |  | Luís M. Vidigal,
Stephen W. Director:
A Design Centering Algorithm for Nonconvex Regions of Acceptability.
IEEE Trans. on CAD of Integrated Circuits and Systems 1(1): 13-24 (1982) |