Romain Fayolle

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2005

1 Isaline Richard, Romain Fayolle, Jean-Claude Lecomte: New experimental approach for failure prediction in electronics: Topography and deformation measurement complemented with acoustic microscopy. Microelectronics Reliability 45(9-11): 1645-1651 (2005)

	2005
1		Isaline Richard, Romain Fayolle, Jean-Claude Lecomte: New experimental approach for failure prediction in electronics: Topography and deformation measurement complemented with acoustic microscopy. Microelectronics Reliability 45(9-11): 1645-1651 (2005)

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