Josef Fazekas

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2004

1 David Smeets, Josef Fazekas: Quantifying charging damage in gate oxides of antenna structures for WLR monitoring. Microelectronics Reliability 44(8): 1245-1250 (2004)

	2004
1		David Smeets, Josef Fazekas: Quantifying charging damage in gate oxides of antenna structures for WLR monitoring. Microelectronics Reliability 44(8): 1245-1250 (2004)

Coauthor Index

1 David Smeets [1]