| 2011 | ||
|---|---|---|
| 64 | Görschwin Fey: Orchestrated multi-level information flow analysis to understand SoCs. DAC 2011: 284-285 | |
| 63 | Mathias Soeken, Ulrich Kühne, Martin Freibothe, Görschwin Fey, Rolf Drechsler: Automatic property generation for the formal verification of bus bridges. DDECS 2011: 417-422 | |
| 62 | Mehdi Dehbashi, André Sülflow, Görschwin Fey: Automated Design Debugging in a Testbench-Based Verification Environment. DSD 2011: 479-486 | |
| 61 | Alexander Finder, André Sülflow, Görschwin Fey: Latency Analysis for Sequential Circuits. European Test Symposium 2011: 129-134 | |
| 60 | Görschwin Fey: Assessing System Vulnerability Using Formal Verification Techniques. MEMICS 2011: 47-56 | |
| 59 | Görschwin Fey, André Sülflow, Stefan Frehse, Rolf Drechsler: Effective Robustness Analysis Using Bounded Model Checking Techniques. IEEE Trans. on CAD of Integrated Circuits and Systems 30(8): 1239-1252 (2011) | |
| 2010 | ||
| 58 | Rolf Drechsler, Görschwin Fey: Formal verification meets robustness checking - Techniques and challenges. DDECS 2010: 4 | |
| 57 | Stefan Frehse, Görschwin Fey, Rolf Drechsler: A better-than-worst-case robustness measure. DDECS 2010: 78-83 | |
| 56 | Stefan Frehse, Görschwin Fey, André Sülflow, Rolf Drechsler: RobuCheck: A Robustness Checker for Digital Circuits. DSD 2010: 226-231 | |
| 55 | Alexander Finder, Görschwin Fey: Evaluating Debugging Algorithms from a Qualitative Perspective. FDL 2010: 37-42 | |
| 54 | Finn Haedicke, Bijan Alizadeh, Görschwin Fey, Masahiro Fujita, Rolf Drechsler: Polynomial datapath optimization using constraint solving and formal modelling. ICCAD 2010: 756-761 | |
| 53 | André Sülflow, Görschwin Fey, Rolf Drechsler: Using QBF to increase accuracy of SAT-based debugging. ISCAS 2010: 641-644 | |
| 52 | Görschwin Fey, André Sülflow, Rolf Drechsler: Towards Unifying Localization and Explanation for Automated Debugging. MTV 2010: 3-8 | |
| 51 | Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Rolf Drechsler: MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. J. Electronic Testing 26(3): 307-322 (2010) | |
| 50 | Görschwin Fey, André Sülflow, Stefan Frehse, Rolf Drechsler: Automatische formale Verifikation der Fehlertoleranz von Schaltkreisen (Automated Formal Verification of Fault Tolerance for Circuits). it - Information Technology 52(4): 216-223 (2010) | |
| 2009 | ||
| 49 | Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Daniel Tille: Test Pattern Generation using Boolean Proof Engines. Springer 2009: I-XII, 1-192 | |
| 48 | Görschwin Fey: Deterministic Algorithms for ATPG under Leakage Constraints. Asian Test Symposium 2009: 313-316 | |
| 47 | Görschwin Fey, André Sülflow, Rolf Drechsler: Computing bounds for fault tolerance using formal techniques. DAC 2009: 190-195 | |
| 46 | André Sülflow, Görschwin Fey, Cécile Braunstein, Ulrich Kühne, Rolf Drechsler: Increasing the accuracy of SAT-based debugging. DATE 2009: 1326-1331 | |
| 45 | Stefan Frehse, Görschwin Fey, André Sülflow, Rolf Drechsler: Robustness Check for Multiple Faults Using Formal Techniques. DSD 2009: 85-90 | |
| 44 | André Sülflow, Ulrich Kühne, Görschwin Fey, Daniel Große, Rolf Drechsler: WoLFram- A Word Level Framework for Formal Verification. IEEE International Workshop on Rapid System Prototyping 2009: 11-17 | |
| 43 | André Sülflow, Robert Wille, Görschwin Fey, Rolf Drechsler: Evaluation of Cardinality Constraints on SMT-Based Debugging. ISMVL 2009: 298-303 | |
| 42 | Frank Rogin, Thomas Klotz, Görschwin Fey, Rolf Drechsler, Steffen Rülke: Advanced verification by automatic property generation. IET Computers & Digital Techniques 3(4): 338-353 (2009) | |
| 41 | Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Jürgen Schlöffel, Daniel Tille: Effiziente Erfüllbarkeitsalgorithmen für die Generierung von Testmustern (Efficient Satisfiability Solving Algorithms for Test Pattern Generation). it - Information Technology 51(2): 102-111 (2009) | |
| 2008 | ||
| 40 | Görschwin Fey, Rolf Drechsler: Robustness and usability in modern design flows. Springer 2008: I-XIII, 1-166 | |
| 39 | André Sülflow, Görschwin Fey, Roderick Bloem, Rolf Drechsler: Using unsatisfiable cores to debug multiple design errors. ACM Great Lakes Symposium on VLSI 2008: 77-82 | |
| 38 | Frank Rogin, Thomas Klotz, Görschwin Fey, Rolf Drechsler, Steffen Rülke: Automatic Generation of Complex Properties for Hardware Designs. DATE 2008: 545-548 | |
| 37 | Robert Wille, Görschwin Fey, Marc Messing, Gerhard Angst, Lothar Linhard, Rolf Drechsler: Identifying a Subset of System Verilog Assertions for Efficient Bounded Model Checking. DSD 2008: 542-549 | |
| 36 | Görschwin Fey, Rolf Drechsler: A Basis for Formal Robustness Checking. ISQED 2008: 784-789 | |
| 35 | Görschwin Fey, Stefan Staber, Roderick Bloem, Rolf Drechsler: Automatic Fault Localization for Property Checking. IEEE Trans. on CAD of Integrated Circuits and Systems 27(6): 1138-1149 (2008) | |
| 34 | Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Daniel Tille: On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1329-1333 (2008) | |
| 33 | Görschwin Fey, Anna Bernasconi, Valentina Ciriani, Rolf Drechsler: On the construction of small fully testable circuits with low depth. Microprocessors and Microsystems - Embedded Hardware Design 32(5-6): 263-269 (2008) | |
| 2007 | ||
| 32 | Daniel Tille, Görschwin Fey, Rolf Drechsler: Instance Generation for SAT-based ATPG. DDECS 2007: 153-156 | |
| 31 | Görschwin Fey, Anna Bernasconi, Valentina Ciriani, Rolf Drechsler: On the Construction of Small Fully Testable Circuits with Low Depth. DSD 2007: 563-569 | |
| 30 | Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler: SAT-based ATPG for Path Delay Faults in Sequential Circuits. ISCAS 2007: 3671-3674 | |
| 29 | Stephan Eggersglüß, Daniel Tille, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: Experimental Studies on SAT-Based ATPG for Gate Delay Faults. ISMVL 2007: 6 | |
| 28 | Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. MEMOCODE 2007: 181-187 | |
| 27 | Görschwin Fey, Tim Warode, Rolf Drechsler: Reusing Learned Information in SAT-based ATPG. VLSI Design 2007: 69-76 | |
| 26 | Robert Wille, Görschwin Fey, Daniel Große, Stephan Eggersglüß, Rolf Drechsler: SWORD: A SAT like prover using word level information. VLSI-SoC 2007: 88-93 | |
| 2006 | ||
| 25 | Görschwin Fey, Sean Safarpour, Andreas G. Veneris, Rolf Drechsler: On the relation between simulation-based and SAT-based diagnosis. DATE 2006: 1139-1144 | |
| 24 | Görschwin Fey, Daniel Große, Rolf Drechsler: Avoiding false negatives in formal verification for protocol-driven blocks. DATE 2006: 1225-1226 | |
| 23 | Stefan Staber, Görschwin Fey, Roderick Bloem, Rolf Drechsler: Automatic Fault Localization for Property Checking. Haifa Verification Conference 2006: 50-64 | |
| 22 | Görschwin Fey, Junhao Shi, Rolf Drechsler: Efficiency of Multi-Valued Encoding in SAT-based ATPG. ISMVL 2006: 25 | |
| 21 | Rolf Drechsler, Görschwin Fey: Automatic Test Pattern Generation. SFM 2006: 30-55 | |
| 20 | Rolf Drechsler, Görschwin Fey, Sebastian Kinder: An Integrated Approach for Combining BDD and SAT Provers. VLSI Design 2006: 237-242 | |
| 19 | Görschwin Fey, Rolf Drechsler: Minimizing the number of paths in BDDs: Theory and algorithm. IEEE Trans. on CAD of Integrated Circuits and Systems 25(1): 4-11 (2006) | |
| 18 | Görschwin Fey: Increasing robustness and usability of circuit design tools by using formal techniques. Universität Bremen 2006: I-VIII, 1-164 | |
| 2005 | ||
| 17 | Rüdiger Ebendt, Görschwin Fey, Rolf Drechsler: Advanced BDD optimization. Springer 2005: I-X, 1-222 | |
| 16 | Sean Safarpour, Görschwin Fey, Andreas G. Veneris, Rolf Drechsler: Utilizing don't care states in SAT-based bounded sequential problems. ACM Great Lakes Symposium on VLSI 2005: 264-269 | |
| 15 | Junhao Shi, Görschwin Fey, Rolf Drechsler: Bridging fault testability of BDD circuits. ASP-DAC 2005: 188-191 | |
| 14 | Rolf Drechsler, Görschwin Fey, Christian Genz, Daniel Große: SyCE: An Integrated Environment for System Design in SystemC. IEEE International Workshop on Rapid System Prototyping 2005: 258-260 | |
| 13 | Sebastian Kinder, Görschwin Fey, Rolf Drechsler: Controlling the Memory During Manipulation of Word-Level Decision Diagrams. ISMVL 2005: 250-255 | |
| 12 | Junhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ISVLSI 2005: 212-217 | |
| 2004 | ||
| 11 | Görschwin Fey, Rolf Drechsler: Improving simulation-based verification by means of formal methods. ASP-DAC 2004: 640-643 | |
| 10 | Klaus Winkelmann, Hans-Joachim Trylus, Dominik Stoffel, Görschwin Fey: Cost-Efficient Block Verification for a UMTS Up-Link Chip-Rate Coprocessor. DATE 2004: 162-167 | |
| 9 | Görschwin Fey, Junhao Shi, Rolf Drechsler: BDD Circuit Optimization for Path Delay Fault Testability. DSD 2004: 168-172 | |
| 8 | Nicole Drechsler, Mario Hilgemeier, Görschwin Fey, Rolf Drechsler: Disjoint Sum of Product Minimization by Evolutionary Algorithms. EvoWorkshops 2004: 198-207 | |
| 7 | Görschwin Fey, Rolf Drechsler, Maciej J. Ciesielski: Algorithms for Taylor Expansion Diagrams. ISMVL 2004: 235-240 | |
| 6 | Rolf Drechsler, Junhao Shi, Görschwin Fey: Synthesis of fully testable circuits from BDDs. IEEE Trans. on CAD of Integrated Circuits and Systems 23(3): 440-443 (2004) | |
| 2003 | ||
| 5 | Rolf Drechsler, Junhao Shi, Görschwin Fey: MuTaTe: an efficient design for testability technique for multiplexor based circuits. ACM Great Lakes Symposium on VLSI 2003: 80-83 | |
| 4 | Junhao Shi, Görschwin Fey, Rolf Drechsler: BDD Based Synthesis of Symmetric Functions with Full Path-Delay Fault Testability. Asian Test Symposium 2003: 290-293 | |
| 3 | Daniel Große, Görschwin Fey, Rolf Drechsler: Modeling Multi-Valued Circuits in SystemC. ISMVL 2003: 281-286 | |
| 2 | Görschwin Fey, Sebastian Kinder, Rolf Drechsler: Using Games for Benchmarking and Representing the Complete Solution Space using Symbolic Techniques. ISMVL 2003: 361-366 | |
| 1 | Görschwin Fey, Rolf Drechsler: Finding Good Counter-Examples to Aid Design Verification. MEMOCODE 2003: 51- | |
Colors in the list of coauthors
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