Joan Figueras

	2009
71		Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras: Delay caused by resistive opens in interconnecting lines. Integration 42(3): 286-293 (2009)
	2008
70		Francesc Moll, Joan Figueras, Antonio Rubio: Data Dependence of Delay Distribution for a Planar Bus. PATMOS 2008: 409-418
69		Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman: Full Open Defects in Nanometric CMOS. VTS 2008: 119-124
68		Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras: Experimental Characterization of CMOS Interconnect Open Defects. IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 123-136 (2008)
	2007
67		Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi: Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS 2007: 145-150
66		Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi: Diagnosis of Full Open Defects in Interconnecting Lines. VTS 2007: 158-166
65		Salvador Manich, L. Garcia-Deiros, Joan Figueras: Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources. IEEE Trans. on CAD of Integrated Circuits and Systems 26(11): 2046-2058 (2007)
	2006
64		L. Balado, E. Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras: Lissajous Based Mixed-Signal Testing for N-Observable Signals. DDECS 2006: 125-130
	2005
63		R. Sanahuja, V. Barcons, L. Balado, Joan Figueras: Testing Biquad Filters under Parametric Shifts Using X-Y Zoning. J. Electronic Testing 21(3): 257-265 (2005)
	2004
62		Salvador Manich, L. García, L. Balado, E. Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras: BIST Technique by Equally Spaced Test Vector Sequences. VTS 2004: 206-216
61		Rosa Rodríguez-Montañés, D. Muñoz, L. Balado, Joan Figueras: Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. J. Electronic Testing 20(2): 143-153 (2004)
60		Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, L. Balado, Joan Figueras: On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. J. Electronic Testing 20(4): 345-355 (2004)
	2003
59		Yves Bertrand, Marie-Lise Flottes, L. Balado, Joan Figueras, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich, J.-P. Van der Heyden: Test Engineering Education in Europe: the EuNICE-Test Project. MSE 2003: 85-86
	2002
58		Rosa Rodríguez-Montañés, D. Muñoz, L. Balado, Joan Figueras: Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. IOLTW 2002: 99-103
57		Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras: RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. ITC 2002: 814-823
56		Antoni Ferré, Joan Figueras: Leakage power bounds in CMOS digital technologies. IEEE Trans. on CAD of Integrated Circuits and Systems 21(6): 731-738 (2002)
	2001
55		Michel Renovell, Penelope Faure, Jean Michel Portal, Joan Figueras, Yervant Zorian: IS-FPGA : a new symmetric FPGA architecture with implicit scan. ITC 2001: 924-931
54		Antonio Zenteno, Víctor H. Champac, Joan Figueras: Detectability Conditions of Full Opens in the Interconnections. J. Electronic Testing 17(2): 85-95 (2001)
53		Paolo Prinetto, Joan Figueras: Guest Editorial. J. Electronic Testing 17(3-4): 207 (2001)
52		Antoni Ferré, Joan Figueras: LEAP: An Accurate Defect-Free IDDQ Estimator. J. Electronic Testing 17(3-4): 267-274 (2001)
51		Michel Renovell, Jean Michel Portal, Penelope Faure, Joan Figueras, Yervant Zorian: A Discussion on Test Pattern Generation for FPGA - Implemented Circuits. J. Electronic Testing 17(3-4): 283-290 (2001)
50		Anna Maria Brosa, Joan Figueras: Digital Signature Proposal for Mixed-Signal Circuits. J. Electronic Testing 17(5): 385-393 (2001)
	2000
49		Michel Renovell, Jean Michel Portal, Penelope Faure, Joan Figueras, Yervant Zorian: TOF: a tool for test pattern generation optimization of an FPGA application oriented test. Asian Test Symposium 2000: 323-328
48		Anna Maria Brosa, Joan Figueras: Digital signature proposal for mixed-signal circuits. ITC 2000: 1041-1050
47		Salvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, P. Teixeira, M. Santos: Low Power BIST by Filtering Non-Detecting Vectors. J. Electronic Testing 16(3): 193-202 (2000)
46		Anna Maria Brosa, Joan Figueras: On Maximizing the Coverage of Catastrophic and Parametric Faults. J. Electronic Testing 16(3): 251-258 (2000)
45		Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: An Approach to Minimize the Test Configuration for the Logic Cells of the Xilinx XC4000 FPGAs Family. J. Electronic Testing 16(3): 289-299 (2000)
44		Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: Testing the Local Interconnect Resources of SRAM-Based FPGA's. J. Electronic Testing 16(5): 513-520 (2000)
	1999
43		Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: Minimizing the Number of Test Configurations for Different FPGA Families. Asian Test Symposium 1999: 363-368
42		Josep Rius, Joan Figueras: Exploring the Combination of IDDQ and iDDt Testing: Energy Testing. DATE 1999: 543-548
41		Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: Testing the Configurable Interconnect/Logic Interface of SRAM-Based FPGA's. DATE 1999: 618-622
40		Anna Maria Brosa, Joan Figueras: On Optimizing Test Strategies for Analog Cells. Great Lakes Symposium on VLSI 1999: 92-96
39		Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Joan Figueras, Salvador Manich, P. Teixeira, M. Santos: Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity. ISCAS (1) 1999: 110-113
38		Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: SRAM-Based FPGAs: Testing the Embedded RAM Modules. J. Electronic Testing 14(1-2): 159-167 (1999)
37		Anna Maria Brosa, Joan Figueras: Characterization of Floating Gate Defects in Analog Cells. J. Electronic Testing 14(1-2): 23-31 (1999)
36		Víctor H. Champac, José Castillejos, Joan Figueras: IDDQ Testing of Opens in CMOS SRAMs. J. Electronic Testing 15(1-2): 53-62 (1999)
	1998
35		Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: SRAM-Based FPGA's: Testing the Interconnect/Logic Interface. Asian Test Symposium 1998: 266-271
34		Rosa Rodríguez-Montañés, Joan Figueras: Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs. DATE 1998: 490-494
33		Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: RAM-Based FPGA's: A Test Approach for the Configurable Logic. DATE 1998: 82-88
32		Cecilia Metra, Michel Renovell, G. Mojoli, Jean Michel Portal, Sandro Pastore, Joan Figueras, Yervant Zorian, Davide Salvi, Giacomo R. Sechi: Novel Technique for Testing FPGAs. DATE 1998: 89-
31		Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: SRAM-Based FPGAs: A Fault Model for the Configurable Logig Modules. FPL 1998: 139-148
30		Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: SRAM-based FPGA's: testing the LUT/RAM modules. ITC 1998: 1102-1111
29		Víctor H. Champac, José Castillejos, Joan Figueras: IDDQ Testing of Opens in CMOS SRAMs. VTS 1998: 106-111
28		Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: Testing the Interconnect of RAM-Based FPGAs. IEEE Design & Test of Computers 15(1): 45-50 (1998)
27		Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras: IDDQ testing: state of the art and future trends. Integration 26(1-2): 167-196 (1998)
	1997
26		Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: Test Pattern and Test Configuration Generation Methodology for the Logic of RAM-Based FPGA. Asian Test Symposium 1997: 254-
25		Salvador Manich, Joan Figueras: Maximizing the weighted switching activity in combinational CMOS circuits under the variable delay model. ED&TC 1997: 597-602
24		Antoni Ferré, Joan Figueras: IDDQ Characterization in Submicron CMOS. ITC 1997: 136-145
23		Michel Renovell, Joan Figueras, Yervant Zorian: Test of RAM-based FPGA: methodology and application to the interconnect. VTS 1997: 230-237
22		Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian: Power Dissipation During Testing: Should We Worry About it? VTS 1997: 456-457
21		Rosa Rodríguez-Montañés, Joan Figueras: Bridges in sequential CMOS circuits: current-voltage signatur. VTS 1997: 68-73
20		Michael Nicolaidis, Ricardo de Oliveira Duarte, Salvador Manich, Joan Figueras: Fault-Secure Parity Prediction Arithmetic Operators. IEEE Design & Test of Computers 14(2): 60-71 (1997)
	1996
19		Antoni Ferré, Joan Figueras: On estimating bounds of the quiescent current for I/sub DDQ/ testin. VTS 1996: 106-111
18		Salvador Manich, Michael Nicolaidis, Joan Figueras: Enhancing realistic fault secureness in parity prediction array arithmetic operators by I/sub DDQ/ monitoring. VTS 1996: 124-129
17		Rosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras: Bridging defects resistance in the metal layer of a CMOS process. J. Electronic Testing 8(1): 35-46 (1996)
16		Josep Rius, Joan Figueras: Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments. J. Electronic Testing 9(3): 295-310 (1996)
	1995
15		Víctor H. Champac, Joan Figueras: Testability of floating gate defects in sequential circuits. VTS 1995: 202-207
14		Josep Rius, Joan Figueras: Detecting I/sub DDQ/ defective CMOS circuits by depowering. VTS 1995: 324-329
13		Eugeni Isern, Joan Figueras: IDDQ Test and Diagnosis of CMOS Circuits. IEEE Design & Test of Computers 12(4): 60-67 (1995)
12		Joan Figueras, Michel Renovell: Current testing in dynamic CMOS circuits. J. Electronic Testing 6(1): 127-131 (1995)
	1994
11		Rosa Rodríguez-Montañés, Joan Figueras: Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability. EDAC-ETC-EUROASIC 1994: 356-360
10		Eugeni Isern, Joan Figueras: Test of Bridging Faults in Scan-based Sequential Circuits. EDAC-ETC-EUROASIC 1994: 366-370
9		Víctor H. Champac, Antonio Rubio, Joan Figueras: Electrical model of the floating gate defect in CMOS ICs: implications on IDDQ testing. IEEE Trans. on CAD of Integrated Circuits and Systems 13(3): 359-369 (1994)
	1993
8		Víctor H. Champac, Antonio Rubio, Joan Figueras: Analysis of the Floating Gate Defect in CMOS. DFT 1993: 101-108
7		Michel Renovell, Joan Figueras: Current Testing Viability in Dynamic CMOS Circuits. DFT 1993: 207-214
6		Eugeni Isern, Joan Figueras: Test Generation with High Coverages for Quiescent Current Test of Bridging Faults in Combinational Circuits. ITC 1993: 73-82
	1992
5		Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls: Bridging Defects Resistance Measurements in a CMOS Process. ITC 1992: 892-899
4		J. A. Segura, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio: Quiescent current analysis and experimentation of defective CMOS circuits. J. Electronic Testing 3(4): 337-348 (1992)
3		Josep Rius, Joan Figueras: Proportional BIC sensor for current testing. J. Electronic Testing 3(4): 387-396 (1992)
	1991
2		Rosa Rodríguez-Montañés, J. A. Segura, Víctor H. Champac, Joan Figueras, J. A. Rubio: Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS. ITC 1991: 510-519
1		Juan A. Carrasco, Joan Figueras, Annie Kuntzmann-Combelles: Evaluation of safety-oriented two-version architectures. Journal of Systems and Software 14(3): 155-162 (1991)

Coauthor Index

1	Vishwani D. Agrawal	[22]
2	Robert C. Aitken (Rob Aitken)	[22]
3	Daniel Arumí	[66] [67] [68] [69] [71]
4	L. Balado	[58] [59] [60] [61] [62] [63] [64]
5	V. Barcons	[63]
6	Yves Bertrand	[59]
7	Anton Biasizzo	[59]
8	J. Braden	[22]
9	Anna Maria Brosa	[37] [40] [46] [48] [50]
10	Eric Bruls (E. M. J. G. Bruls)	[5] [17]
11	Stefano Di Carlo	[59]
12	Juan A. Carrasco	[1]
13	José Castillejos	[29] [36]
14	Víctor H. Champac (Víctor H. Champac Vilela)	[2] [4] [8] [9] [15] [29] [36] [54]
15	Annie Combelles (Annie Kuntzmann-Combelles)	[1]
16	Ricardo de Oliveira Duarte	[20]
17	Stefan Eichenberger	[66] [67] [69]
18	Penelope Faure	[49] [51] [55]
19	Antoni Ferré	[19] [24] [27] [52] [56]
20	Marie-Lise Flottes	[59]
21	A. Gabarró	[47]
22	L. García	[62] [64]
23	L. Garcia-Deiros	[65]
24	Patrick Girard	[39] [47]
25	Loïs Guiller	[39] [47]
26	J.-P. Van der Heyden	[59]
27	Camelia Hora	[66] [67] [69]
28	Eugeni Isern	[6] [10] [13] [27]
29	Bram Kruseman	[66] [67] [69]
30	S. Kumar	[22]
31	Christian Landrault	[39] [47]
32	M. Lopez	[47]
33	Maurice Lousberg	[66] [67]
34	E. Lupon	[62] [64]
35	Ananta K. Majhi	[66] [67]
36	Salvador Manich	[18] [20] [25] [39] [47] [57] [60] [62] [65]
37	Cecilia Metra	[32]
38	G. Mojoli	[32]
39	Francesc Moll	[70]
40	D. Muñoz	[58] [61]
41	Michael Nicolaidis	[18] [20]
42	Franc Novak	[59]
43	Sandro Pastore	[32]
44	Jean Michel Portal	[26] [28] [30] [31] [32] [33] [35] [38] [41] [43] [44] [45] [49] [51] [55]
45	Serge Pravossoudovitch	[39] [47]
46	N. Pricopi	[59]
47	Paolo Prinetto	[53] [59]
48	Michel Renovell	[7] [12] [23] [26] [28] [30] [31] [32] [33] [35] [38] [41] [43] [44] [45] [49] [51] [55]
49	Josep Rius	[3] [14] [16] [27] [42] [62]
50	Rosa Rodríguez-Montañés	[2] [4] [5] [11] [17] [21] [27] [34] [57] [58] [61] [62] [64] [66] [67] [68] [69] [71]
51	Antonio Rubio	[8] [9] [70]
52	J. A. Rubio	[2] [4]
53	Davide Salvi	[32]
54	R. Sanahuja	[63]
55	M. Santos	[39] [47]
56	Marcelino B. Santos	[57] [60]
57	Giacomo R. Sechi	[32]
58	J. A. Segura	[2] [4]
59	Isabel C. Teixeira	[57] [60]
60	João Paulo Teixeira	[57] [60]
61	P. Teixeira	[39] [47]
62	Hans-Joachim Wunderlich	[22] [59]
63	Antonio Zenteno	[54]
64	Yervant Zorian	[22] [23] [26] [28] [30] [31] [32] [33] [35] [38] [41] [43] [44] [45] [49] [51] [55]

Colors in the list of coauthors