| 2006 | ||
|---|---|---|
| 5 | Dragica Vasileska, Santhosh Krishnan, Massimo V. Fischetti: Examining Performance Enhancement of p-Channel Strained-SiGe MOSFET Devices. Numerical Methods and Applications 2006: 189-196 | |
| 4 | Wilfried Haensch, Edward J. Nowak, Robert H. Dennard, Paul M. Solomon, Andres Bryant, Omer H. Dokumaci, Arvind Kumar, Xinlin Wang, Jeffrey B. Johnson, Massimo V. Fischetti: Silicon CMOS devices beyond scaling. IBM Journal of Research and Development 50(4-5): 339-362 (2006) | |
| 2005 | ||
| 3 | Santhosh Krishnan, Dragica Vasileska, Massimo V. Fischetti: Hole transport in p-channel Si MOSFETs. Microelectronics Journal 36(3-6): 323-326 (2005) | |
| 2001 | ||
| 2 | J. C. Tsang, Massimo V. Fischetti: Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies. Microelectronics Reliability 41(9-10): 1465-1470 (2001) | |
| 1992 | ||
| 1 | Wai Lee, Steven E. Laux, Massimo V. Fischetti, Giorgio Baccarani, Antonio Gnudi, Johannes M. C. (Hans) Stork, Jack A. Mandelman, Emmanuel F. Crabbé, Matthew R. Wordeman, Farouk Odeh: Numerical modeling of advanced semiconductor devices. IBM Journal of Research and Development 36(2): 208-232 (1992) | |