Pascal Fouillat

	2009
14		Timothée Levi, Jean Tomas, Noëlle Lewis, Pascal Fouillat: A CMOS Resizing Methodology for Analog Circuits. IEEE Design & Test of Computers 26(1): 78-87 (2009)
	2006
13		A. Douin, V. Pouget, M. De Matos, D. Lewis, Philippe Perdu, Pascal Fouillat: Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectronics Reliability 46(9-11): 1514-1519 (2006)
	2005
12		A. Douin, V. Pouget, D. Lewis, Pascal Fouillat, Philippe Perdu: Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS 2005: 9-13
11		Abdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, D. Lewis, Pascal Fouillat: Impact of semiconductors material on IR Laser Stimulation signal. Microelectronics Reliability 45(9-11): 1465-1470 (2005)
	2003
10		T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto: A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability 43(1): 173-177 (2003)
9		T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
8		T. Beauchêne, D. Trémouilles, D. Lewis, Philippe Perdu, Pascal Fouillat: Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectronics Reliability 43(9-11): 1577-1582 (2003)
7		F. Darracq, Hervé Lapuyade, N. Buard, Pascal Fouillat, R. Dufayel, T. Carriere: Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectronics Reliability 43(9-11): 1615-1619 (2003)
	2001
6		D. Lewis, Hervé Lapuyade, Yann Deval, Y. Maidon, F. Darracq, R. Briand, Pascal Fouillat: A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW 2001: 111-
5		D. Lewis, V. Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu: Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability 41(9-10): 1471-1476 (2001)
4		V. Pouget, Hervé Lapuyade, Pascal Fouillat, D. Lewis, S. Buchner: Theoretical Investigation of an Equivalent Laser LET. Microelectronics Reliability 41(9-10): 1513-1518 (2001)
	2000
3		V. Pouget, Pascal Fouillat, D. Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet: An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW 2000: 52-
	1999
2		Jean Tomas, Yann Deval, Jean-Baptiste Begueret, Pascal Fouillat, J. L. Aucouturier: A New Industrial Approach Compatible With Microelectronics Education: Application to an RF System Design. MSE 1999: 37-38
1		T. Zimmer, N. Milet-Lewis, Ahmed Fakhfakh, B. Ardouin, H. Levi, J. B. Duluc, Pascal Fouillat: Hierarchical Analogue Design and Behavioural Modelling. MSE 1999: 59-60

Coauthor Index

1	B. Ardouin	[1]
2	J. L. Aucouturier	[2]
3	M. Bafleur	[9]
4	T. Beauchêne	[5] [8] [9] [10]
5	Felix Beaudoin	[5] [9] [10] [11]
6	Jean-Baptiste Begueret	[2]
7	R. Briand	[6]
8	N. Buard	[7]
9	S. Buchner	[4]
10	T. Carriere	[7]
11	Y. Danto	[10]
12	F. Darracq	[6] [7]
13	Romain Desplats	[9]
14	Yann Deval	[2] [6]
15	A. Douin	[12] [13]
16	R. Dufayel	[7]
17	J. B. Duluc	[1]
18	S. Duzellier	[3]
19	R. Ecoffet	[3]
20	Ahmed Fakhfakh	[1]
21	Abdellatif Firiti	[11]
22	G. Haller	[11]
23	Hervé Lapuyade	[3] [4] [5] [6] [7]
24	H. Levi	[1]
25	Timothée Levi	[14]
26	D. Lewis	[3] [4] [5] [6] [8] [9] [10] [11] [12] [13]
27	Noëlle Lewis	[14]
28	Y. Maidon	[6]
29	M. De Matos	[13]
30	N. Milet-Lewis	[1]
31	Philippe Perdu	[5] [8] [9] [10] [11] [12] [13]
32	V. Pouget	[3] [4] [5] [9] [10] [12] [13]
33	F. M. Roche	[3]
34	L. Sarger	[3]
35	Jean Tomas	[2] [14]
36	A. Touboul	[5]
37	D. Trémouilles	[8] [9]
38	T. Zimmer	[1]