S. Freeman

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1997

1 Debashis Bhattacharya, S. Freeman, W. Lin: Optimizing Test Hardware for At-Speed Testing of Datapaths in an Integrated Circuit. VLSI Design 1997: 289-296

	1997
1		Debashis Bhattacharya, S. Freeman, W. Lin: Optimizing Test Hardware for At-Speed Testing of Datapaths in an Integrated Circuit. VLSI Design 1997: 289-296

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