Zhenghao Gan

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2006

2 Cher Ming Tan, Zhenghao Gan, Tai Chong Chai: Feasibility study of the application of voltage contrast to printed circuit board. Microelectronics Reliability 46(5-6): 939-948 (2006)

2005

1 Cher Ming Tan, Zhenghao Gan, Wai Fung Ho, Sam Chen, Robert Liu: Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications. Microelectronics Reliability 45(1): 179-184 (2005)

	2006
2		Cher Ming Tan, Zhenghao Gan, Tai Chong Chai: Feasibility study of the application of voltage contrast to printed circuit board. Microelectronics Reliability 46(5-6): 939-948 (2006)
	2005
1		Cher Ming Tan, Zhenghao Gan, Wai Fung Ho, Sam Chen, Robert Liu: Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications. Microelectronics Reliability 45(1): 179-184 (2005)

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