Frank Gao

	2003
2		Frank Gao: High reliability in PHEMT MMICs with dual-etch-stop AlAs layers for high-speed RF switch applications. Microelectronics Reliability 43(6): 829-837 (2003)
	2002
1		Frank Gao, Ravi Chanana, Tom Nicholls: The effects of buffer thickness on GaAs MESFET characteristics: channel-substrate current, drain breakdown, and reliability. Microelectronics Reliability 42(7): 1003-1010 (2002)

Coauthor Index

1	Ravi Chanana	[1]
2	Tom Nicholls	[1]