Anne E. Gattiker

	2006
22		Anne E. Gattiker: IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM. ISPD 2006: 47
21		Kerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer: High-performance CMOS variability in the 65-nm regime and beyond. IBM Journal of Research and Development 50(4-5): 433-450 (2006)
20		Anne E. Gattiker: Getting More out of ITC. IEEE Design & Test of Computers 23(5): 432 (2006)
	2004
19		Anne E. Gattiker: Diagnosis Meets Physical Failure Analysis: How Long can we Succeed? ITC 2004: 1441
18		Phil Nigh, Anne E. Gattiker: Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. ITC 2004: 309-318
	2003
17		Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey: Deformations of IC Structure in Test and Yield Learning. ITC 2003: 856-865
16		James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker: Power supply transient signal analysis for defect-oriented test. IEEE Trans. on CAD of Integrated Circuits and Systems 22(3): 370-374 (2003)
	2002
15		Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long: Static timing analysis based circuit-limited-yield estimation. ISCAS (5) 2002: 81-84
14		Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu: Test structures for delay variability. Timing Issues in the Specification and Synthesis of Digital Systems 2002: 109
13		Abhishek Singh, Jim Plusquellic, Anne E. Gattiker: Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models. VTS 2002: 357-366
12		Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly: Modeling the Economics of Testing: A DFT Perspective. IEEE Design & Test of Computers 19(1): 29-41 (2002)
	2001
11		Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long: Timing Yield Estimation from Static Timing Analysis. ISQED 2001: 437-442
10		Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker: Detecting delay faults using power supply transient signal analysis. ITC 2001: 395-404
	2000
9		Phil Nigh, Anne E. Gattiker: Test method evaluation experiments and data. ITC 2000: 454-463
	1998
8		Anne E. Gattiker, Wojciech Maly: Toward understanding "Iddq-only" fails. ITC 1998: 174-183
	1997
7		Anne E. Gattiker, Wojciech Maly: Current signatures: application [to CMOS]. ITC 1997: 1168-1177
6		Anne E. Gattiker, Wojciech Maly: Current Signatures: Application. ITC 1997: 156-165
5		Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly: To DFT or Not to DFT? ITC 1997: 557-566
4		Anne E. Gattiker, Wojciech Maly: Smart Substrate MCMs. J. Electronic Testing 10(1-2): 39-53 (1997)
	1996
3		Anne E. Gattiker, Wojciech Maly: Current signatures [VLSI circuit testing]. VTS 1996: 112-117
	1994
2		Anne E. Gattiker, Wojciech Maly: Feasibility Study of Smart Substrate Multichip Modules. ITC 1994: 41-49
1		Wojciech Maly, Derek Feltham, Anne E. Gattiker, Mark D. Hobaugh, Kenneth Backus, Michael E. Thomas: Smart-Substrate Multichip-Module Systems. IEEE Design & Test of Computers 11(2): 64-73 (1994)

Coauthor Index

1	Kenneth Backus	[1]
2	Kerry Bernstein	[21]
3	R. D. (Shawn) Blanton (Ronald D. Blanton)	[5] [12] [17]
4	Duane S. Boning	[14]
5	Rashmi Dinakar	[11] [15]
6	Derek Feltham	[1]
7	David J. Frank	[21]
8	Karen Gonzalez-Valentin	[14]
9	Wilfried Haensch	[21]
10	Mark D. Hobaugh	[1]
11	Brian L. Ji	[21]
12	Shirong Liao	[10]
13	Frank Liu	[14]
14	Chris Long	[11] [15]
15	Wojciech Maly	[1] [2] [3] [4] [5] [6] [7] [8] [12] [17]
16	Chandler McDowell	[14]
17	Pranab K. Nag	[5] [12]
18	Sani R. Nassif	[11] [14] [15] [21]
19	Phil Nigh	[9] [18]
20	Edward J. Nowak	[21]
21	Joseph Panganiban	[14]
22	Chintan Patel	[10] [16]
23	Dale J. Pearson	[21]
24	James F. Plusquellic (Jim Plusquellic)	[10] [13] [16]
25	Norman J. Rohrer	[21]
26	Abhishek Singh	[10] [13] [16]
27	Thomas M. Storey	[17]
28	Michael E. Thomas	[1]
29	Thomas J. Vogels	[17]
30	Sichao Wei	[5] [12]
31	Thomas Zanon	[17]

Colors in the list of coauthors