 | 2000 |
|---|
| 4 |       | James F. Plusquellic,
Amy Germida,
Jonathan Hudson,
Ernesto Staroswiecki,
Chintan Patel:
Predicting device performance from pass/fail transient signal analysis data.
ITC 2000: 1070-1079 |
| 3 |  | Amy Germida,
James F. Plusquellic:
Detection of CMOS Defects under Variable Processing Conditions.
VTS 2000: 195-204 |
| 1999 |
|---|
| 2 | | James F. Plusquellic,
Amy Germida,
Zheng Yan:
8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS Defects.
DFT 1999: 68-76 |
| 1 | | Amy Germida,
Zheng Yan,
James F. Plusquellic,
Fidel Muradali:
Defect detection using power supply transient signal analysis.
ITC 1999: 67-76 |
