N. Giaquinto

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2007

1 F. Attivissimo, N. Giaquinto, M. Savino: Worst-case uncertainty measurement in ADC-based instruments. Computer Standards & Interfaces 29(1): 5-10 (2007)

	2007
1		F. Attivissimo, N. Giaquinto, M. Savino: Worst-case uncertainty measurement in ADC-based instruments. Computer Standards & Interfaces 29(1): 5-10 (2007)

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