Pamela S. Gillis

	2004
6		Pamela S. Gillis, Francis Woytowich, Andrew Ferko, Kevin McCauley: Low Overhead Delay Testing of ASICS. ITC 2004: 534-542
	1998
5		Pamela S. Gillis, Francis Woytowich, Kevin McCauley, Ulrich Baur: Delay test of chip I/Os using LSSD boundary scan. ITC 1998: 83-90
	1996
4		Pamela S. Gillis, Tom S. Guzowski, Brion L. Keller, Randal H. Kerr: Test methodologies and design automation for IBM ASICs. IBM Journal of Research and Development 40(4): 461-474 (1996)
	1991
3		Robert W. Bassett, Pamela S. Gillis, John J. Shushereba: High-Density CMOS Multichip-Module Testing and Diagnosis. ITC 1991: 530-539
	1990
2		Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater: Low-Cost Testing of High-Density Logic Components. IEEE Design & Test of Computers 7(2): 15-28 (1990)
	1989
1		Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater: Low Cost Testing of High Density Logic Components. ITC 1989: 550-557

Coauthor Index

1	Robert W. Bassett	[1] [2] [3]
2	Ulrich Baur	[5]
3	Barry J. Butkus	[1] [2]
4	Stephen L. Dingle	[1] [2]
5	Marc R. Faucher	[1] [2]
6	Andrew Ferko	[6]
7	Tom S. Guzowski	[4]
8	Brion L. Keller	[4]
9	Randal H. Kerr	[4]
10	Kevin McCauley	[5] [6]
11	Jeannie H. Panner	[1] [2]
12	John G. Petrovick	[1] [2]
13	John J. Shushereba	[3]
14	Donald L. Wheater	[1] [2]
15	Francis Woytowich	[5] [6]