 | 2009 |
|---|
| 4 |       | O. Ginez,
Jean Michel Daga,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel:
A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash.
J. Electronic Testing 25(2-3): 127-144 (2009) |
| 2007 |
|---|
| 3 | | O. Ginez,
Jean Michel Daga,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel:
Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories.
European Test Symposium 2007: 77-84 |
| 2 | | O. Ginez,
Jean Michel Daga,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel:
Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window.
VTS 2007: 47-52 |
| 2006 |
|---|
| 1 | | O. Ginez,
Jean Michel Daga,
Marylene Combe,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel:
An Overview of Failure Mechanisms in Embedded Flash Memories.
VTS 2006: 108-113 |
