| 2009 | ||
|---|---|---|
| 65 | Andreas Apostolakis, Dimitris Gizopoulos, Mihalis Psarakis, Danilo Ravotto, Matteo Sonza Reorda: Test Program Generation for Communication Peripherals in Processor-Based SoC Devices. IEEE Design & Test of Computers 26(2): 52-63 (2009) | |
| 64 | George Xenoulis, Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis: Instruction-Based Online Periodic Self-Testing of Microprocessors with Floating-Point Units. IEEE Trans. Dependable Sec. Comput. 6(2): 124-134 (2009) | |
| 63 | Dimitris Gizopoulos: Online Periodic Self-Test Scheduling for Real-Time Processor-Based Systems Dependability Enhancement. IEEE Trans. Dependable Sec. Comput. 6(2): 152-158 (2009) | |
| 2008 | ||
| 62 | Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA IEEE Computer Society 2008 | |
| 61 | Andreas Apostolakis, Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis: Functional Self-Testing for Bus-Based Symmetric Multiprocessors. DATE 2008: 1304-1309 | |
| 60 | Dimitris Gizopoulos, Kaushik Roy, Patrick Girard, Nicola Nicolici, Xiaoqing Wen: Power-Aware Testing and Test Strategies for Low Power Devices. DATE 2008 | |
| 59 | Dimitris Gizopoulos, Kaushik Roy, Subhasish Mitra, Pia Sanda: Soft Errors: System Effects, Protection Techniques and Case Studies. DATE 2008 | |
| 58 | Nektarios Kranitis, Andreas Merentitis, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos: Hybrid-SBST Methodology for Efficient Testing of Processor Cores. IEEE Design & Test of Computers 25(1): 64-75 (2008) | |
| 57 | Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis, Frosso S. Makri, Miltiadis Hatzimihail: An Input Vector Monitoring Concurrent BIST Architecture Based on a Precomputed Test Set. IEEE Trans. Computers 57(8): 1012-1022 (2008) | |
| 56 | Dimitris Gizopoulos, Mihalis Psarakis, Miltiadis Hatzimihail, M. Maniatakos, Antonis M. Paschalis, Anand Raghunathan, Srivaths Ravi: Systematic Software-Based Self-Test for Pipelined Processors. IEEE Trans. VLSI Syst. 16(11): 1441-1453 (2008) | |
| 2007 | ||
| 55 | George Xenoulis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: On-Line Periodic Self-Testing of High-Speed Floating-Point Units in Microprocessors. DFT 2007: 379-387 | |
| 54 | Andreas Merentitis, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos: Selecting Power-Optimal SBST Routines for On-Line Processor Testing. European Test Symposium 2007: 111-116 | |
| 53 | Andreas Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: A Functional Self-Test Approach for Peripheral Cores in Processor-Based SoCs. IOLTS 2007: 271-276 | |
| 52 | Dimitris Gizopoulos, Robert C. Aitken, S. Kundu: Guest Editorial: Special Section on "Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems". IEEE Trans. VLSI Syst. 15(5): 493-494 (2007) | |
| 51 | Andreas Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: Functional Processor-Based Testing of Communication Peripherals in Systems-on-Chip. IEEE Trans. VLSI Syst. 15(8): 971-975 (2007) | |
| 2006 | ||
| 50 | Mihalis Psarakis, Dimitris Gizopoulos, Miltiadis Hatzimihail, Antonis M. Paschalis, Anand Raghunathan, Srivaths Ravi: Systematic software-based self-test for pipelined processors. DAC 2006: 393-398 | |
| 49 | Nektarios Kranitis, Andreas Merentitis, N. Laoutaris, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis: Optimal periodic testing of intermittent faults in embedded pipelined processor applications. DATE 2006: 65-70 | |
| 48 | P. Kenterlis, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Mihalis Psarakis: A Low-Cost SEU Fault Emulation Platform for SRAM-Based FPGAs. IOLTS 2006: 235-241 | |
| 47 | George Xenoulis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: Testability Analysis and Scalable Test Generation for High-Speed Floating-Point Units. IEEE Trans. Computers 55(11): 1449-1457 (2006) | |
| 46 | Bashir M. Al-Hashimi, Dimitris Gizopoulos, Manoj Sachdev, Adit D. Singh: New JETTA Editors, 2006. J. Electronic Testing 22(1): 9-10 (2006) | |
| 2005 | ||
| 45 | Miltiadis Hatzimihail, Mihalis Psarakis, George Xenoulis, Dimitris Gizopoulos, Antonis M. Paschalis: Software-Based Self-Test for Pipelined Processors: A Case Study. DFT 2005: 535-543 | |
| 44 | Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis: Accumulator-Based Weighted Pattern Generation. IOLTS 2005: 215-220 | |
| 43 | George Xenoulis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: Test Generation Methodology for High-Speed Floating Point Adders. IOLTS 2005: 227-232 | |
| 42 | Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, George Xenoulis: Software-Based Self-Testing of Embedded Processors. IEEE Trans. Computers 54(4): 461-475 (2005) | |
| 41 | Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis: Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. IEEE Trans. VLSI Syst. 13(9): 1079-1086 (2005) | |
| 40 | Antonis M. Paschalis, Dimitris Gizopoulos: Effective software-based self-test strategies for on-line periodic testing of embedded processors. IEEE Trans. on CAD of Integrated Circuits and Systems 24(1): 88-99 (2005) | |
| 39 | Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: Built-in sequential fault self-testing of array multipliers. IEEE Trans. on CAD of Integrated Circuits and Systems 24(3): 449-460 (2005) | |
| 38 | Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis: A concurrent built-in self-test architecture based on a self-testing RAM. IEEE Transactions on Reliability 54(1): 69-78 (2005) | |
| 2004 | ||
| 37 | Antonis M. Paschalis, Dimitris Gizopoulos: Effective Software-Based Self-Test Strategies for On-Line Periodic Testing of Embedded Processors. DATE 2004: 578-583 | |
| 36 | Yervant Zorian, Dimitris Gizopoulos, Cary Vandenberg, Philippe Magarshack: Guest Editors' Introduction: Design for Yield and Reliability. IEEE Design & Test of Computers 21(3): 177-182 (2004) | |
| 35 | Dimitris Gizopoulos: Low-cost, on-line self-testing of processor cores based on embedded software routines. Microelectronics Journal 35(5): 443-449 (2004) | |
| 2003 | ||
| 34 | Nektarios Kranitis, George Xenoulis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: Low-Cost Software-Based Self-Testing of RISC Processor Cores. DATE 2003: 10714-10719 | |
| 33 | Konstantinos Rokas, Yiorgos Makris, Dimitris Gizopoulos: Low Cost Convolutional Code Based Concurrent Error Detection in FSMs. DFT 2003: 344-351 | |
| 32 | George Xenoulis, Dimitris Gizopoulos, Nektarios Kranitis, Antonis M. Paschalis: Low-Cost, On-Line Software-Based Self-Testing of Embedded Processor Cores. IOLTS 2003: 149- | |
| 31 | Nektarios Kranitis, George Xenoulis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian: Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores. ITC 2003: 431-440 | |
| 30 | Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian: Instruction-Based Self-Testing of Processor Cores. J. Electronic Testing 19(2): 103-112 (2003) | |
| 29 | Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian: Easily Testable Cellular Carry Lookahead Adders. J. Electronic Testing 19(3): 285-298 (2003) | |
| 2002 | ||
| 28 | Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian: Effective Software Self-Test Methodology for Processor Cores. DATE 2002: 592-597 | |
| 27 | Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian: Instruction-Based Self-Testing of Processor Cores. VTS 2002: 223-228 | |
| 2001 | ||
| 26 | Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Mihalis Psarakis, Yervant Zorian: Deterministic software-based self-testing of embedded processor cores. DATE 2001: 92-96 | |
| 25 | Nektarios Kranitis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths. ISQED 2001: 343-349 | |
| 24 | Mihalis Psarakis, Antonis M. Paschalis, Nektarios Kranitis, Dimitris Gizopoulos, Yervant Zorian: Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers. VTS 2001: 15-21 | |
| 23 | Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Mihalis Psarakis, Yervant Zorian: An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths. J. Electronic Testing 17(2): 97-107 (2001) | |
| 2000 | ||
| 22 | Dimitris Gizopoulos, Nektarios Kranitis, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian: Effective Low Power BIST for Datapaths. DATE 2000: 757 | |
| 21 | Dimitris Gizopoulos, Nektarios Kranitis, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian: Low Power/Energy BIST Scheme for Datapaths. VTS 2000: 23-28 | |
| 20 | Nektarios Kranitis, Dimitris Gizopoulos, Antonis M. Paschalis, Mihalis Psarakis, Yervant Zorian: Power-/Energy Efficient BIST Schemes for Processor Data Paths. IEEE Design & Test of Computers 17(4): 15-28 (2000) | |
| 19 | Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: Sequential Fault Modeling and Test Pattern Generation for CMOS Iterative Logic Arrays. IEEE Trans. Computers 49(10): 1083-1099 (2000) | |
| 1999 | ||
| 18 | Antonis M. Paschalis, Nektarios Kranitis, Mihalis Psarakis, Dimitris Gizopoulos, Yervant Zorian: An Effective BIST Architecture for Fast Multiplier Cores. DATE 1999: 117-121 | |
| 17 | Mihalis Psarakis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian: An Effective BIST Architecture for Sequential Fault Testing in Array Multipliers. VTS 1999: 252-259 | |
| 16 | Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: An Effective Built-In Self-Test Scheme for Parallel Multipliers. IEEE Trans. Computers 48(9): 936-950 (1999) | |
| 1998 | ||
| 15 | Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model. VTS 1998: 152-157 | |
| 14 | Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: Effective Built-In Self-Test for Booth Multipliers. IEEE Design & Test of Computers 15(3): 105-111 (1998) | |
| 13 | Antonis M. Paschalis, Dimitris Gizopoulos, Nikolaos Gaitanis: Concurrent Delay Testing in Totally Self-Checking Systems. J. Electronic Testing 12(1-2): 55-61 (1998) | |
| 12 | Antonis M. Paschalis, Nikolaos Gaitanis, Dimitris Gizopoulos, Panagiotis Kostarakis: A Totally Self-Checking 1-out-of-3 Code Error Indicator. J. Electronic Testing 13(1): 61-66 (1998) | |
| 11 | Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: Test Generation and Fault Simulation for Cell Fault Model using Stuck-at Fault Model based Test Tools. J. Electronic Testing 13(3): 315-319 (1998) | |
| 1997 | ||
| 10 | Antonis M. Paschalis, Nikolaos Gaitanis, Dimitris Gizopoulos, Panagiotis Kostarakis: A totally self-checking 1-out-of-3 code error indicator. ED&TC 1997: 450-454 | |
| 9 | Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian, Mihalis Psarakis: An Effective BIST Scheme for Arithmetic Logic Units. ITC 1997: 868-877 | |
| 8 | Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis: Robust Sequential Fault Testing of Iterative Logic Arrays. VTS 1997: 238-244 | |
| 1996 | ||
| 7 | Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: An Effective BIST Scheme for Datapaths. ITC 1996: 76-85 | |
| 6 | Nikolaos Gaitanis, Dimitris Gizopoulos, Antonis M. Paschalis, Panagiotis Kostarakis: An asynchronous totally self-checking two-rail code error indicator. VTS 1996: 151-156 | |
| 5 | Dimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis: Testing CMOS combinational iterative logic arrays for realistic faults. Integration 21(3): 209-228 (1996) | |
| 4 | Dimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis, Constantin Halatsis: C-Testable modified-Booth multipliers. J. Electronic Testing 8(3): 241-260 (1996) | |
| 1995 | ||
| 3 | Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: An effective BIST scheme for carry-save and carry-propagate array multipliers. Asian Test Symposium 1995: 298-302 | |
| 2 | Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: An Effective BIST Scheme for Booth Multipliers. ITC 1995: 824-833 | |
| 1 | Dimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis: Testing combinational iterative logic arrays for realistic faults. VTS 1995: 35-41 | |