Uwe Gläser

	1999
18		H.-Ch. Dahmen, Uwe Gläser, Z. Stamenkovic: Modell Evaluation Using Genetic Manipulation Techniques. Great Lakes Symposium on VLSI 1999: 224-225
17		Fulvio Corno, Uwe Gläser, Paolo Prinetto, Matteo Sonza Reorda, Heinrich Theodor Vierhaus, Massimo Violante: SymFony: a hybrid topological-symbolic ATPG exploiting RT-level information. IEEE Trans. on CAD of Integrated Circuits and Systems 18(2): 191-202 (1999)
	1998
16		H.-Ch. Dahmen, Uwe Gläser: The Impact of Area Optimization for the Power Consumption of Controllers. EUROMICRO 1998: 10204-10207
	1997
15		H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation. Great Lakes Symposium on VLSI 1997: 112-117
14		H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: A Parallel Approach Solving the Test Generation Problem for Synchronous Sequential Circuits. PARCO 1997: 549-556
	1996
13		Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, Uwe Gläser: An ATPG-Based Framework for Verifying Sequential Equivalence. ITC 1996: 865-874
12		H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: Automatic Test Pattern Generation with Optimal Load Balancing. PVM 1996: 205-212
11		Uwe Gläser, Heinrich Theodor Vierhaus: Mixed level test generation for synchronous sequential circuits using the FOGBUSTER algorithm. IEEE Trans. on CAD of Integrated Circuits and Systems 15(4): 410-423 (1996)
	1995
10		Uwe Gläser, Kwang-Ting Cheng: Logic optimization by an improved sequential redundancy addition and removal techniques. ASP-DAC 1995
9		Uwe Gläser, Heinrich Theodor Vierhaus: FOGBUSTER: an efficient algorithm for sequential test generation. EURO-DAC 1995: 230-235
8		Uwe Gläser: Systems Level Specification and Modeling of Reactive Systems: Concepts, Methods, and Tools. EUROCAST 1995: 375-385
7		Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda, Uwe Gläser, Heinrich Theodor Vierhaus: Improving topological ATPG with symbolic techniques. VTS 1995: 338-343
	1994
6		Uwe Gläser, Heinrich Theodor Vierhaus, M. Kley, A. Wiederhold: Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation. ICCAD 1994: 36-39
5		R. Wolber, Uwe Gläser, Heinrich Theodor Vierhaus: Testability Analysis for Test Generation in Synchronous Sequential Circuits. ICCD 1994: 350-353
	1993
4		Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser: CMOS Bridges and Resistive Transistor Faults: IDDQ versus Delay Effects. ITC 1993: 83-91
3		Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser, Raul Camposano: Fault behavior and testability of asynchronous CMOS circuits. Microprocessing and Microprogramming 38(1-5): 223-228 (1993)
	1992
2		Uwe Gläser, Uwe Hübner, Heinrich Theodor Vierhaus: Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects. ITC 1992: 21-29
	1989
1		Uwe Gläser, U. Steinhausen: Fehlererkennung und Fehlertoleranz beim assoziativen RAM(ARAM)-Speicher. Fehlertolerierende Rechensysteme 1989: 320-333

Coauthor Index

1	Raul Camposano	[3]
2	Kuang-Chien Chen	[13]
3	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[10] [13]
4	Fulvio Corno	[7] [17]
5	H.-Ch. Dahmen	[12] [14] [15] [16] [18]
6	Shi-Yu Huang	[13]
7	Uwe Hübner	[2]
8	M. Kley	[6]
9	Wolfgang Meyer	[3] [4]
10	Paolo Prinetto	[7] [17]
11	Matteo Sonza Reorda	[7] [17]
12	Z. Stamenkovic	[18]
13	U. Steinhausen	[1]
14	Heinrich Theodor Vierhaus	[2] [3] [4] [5] [6] [7] [9] [11] [12] [14] [15] [17]
15	Massimo Violante	[17]
16	A. Wiederhold	[6]
17	R. Wolber	[5]

Colors in the list of coauthors