Nihal J. Godambe

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1998

2 Nihal J. Godambe, C.-J. Richard Shi: Behavioral Level Noise Modeling and Jitter Simulation of Phase-Locked Loops with Faults Using VHDL-AMS. J. Electronic Testing 13(1): 7-17 (1998)

1997

1 Nihal J. Godambe, C.-J. Richard Shi: Behavioral level noise modeling and jitter simulation of phase-locked loops with faults using VHDL-AMS. VTS 1997: 177-183

	1998
2		Nihal J. Godambe, C.-J. Richard Shi: Behavioral Level Noise Modeling and Jitter Simulation of Phase-Locked Loops with Faults Using VHDL-AMS. J. Electronic Testing 13(1): 7-17 (1998)
	1997
1		Nihal J. Godambe, C.-J. Richard Shi: Behavioral level noise modeling and jitter simulation of phase-locked loops with faults using VHDL-AMS. VTS 1997: 177-183

Coauthor Index

1 C.-J. Richard Shi [1] [2]