Vijayram Gopu

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2004

1 Patrick J. Schroeder, Pankaj Bolaki, Vijayram Gopu: Comparing the Fault Detection Effectiveness of N-way and Random Test Suites. ISESE 2004: 49-59

	2004
1		Patrick J. Schroeder, Pankaj Bolaki, Vijayram Gopu: Comparing the Fault Detection Effectiveness of N-way and Random Test Suites. ISESE 2004: 49-59

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