Shalabh Goyal Coauthor index DBLP Vis pubzone.org

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DBLP keys2008
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShalabh Goyal, Abhijit Chatterjee: Linearity Testing of A/D Converters Using Selective Code Measurement. J. Electronic Testing 24(6): 567-576 (2008)
2007
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShalabh Goyal, Abhijit Chatterjee, Michael Purtell: A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. J. Electronic Testing 23(1): 95-106 (2007)
2006
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShalabh Goyal, Abhijit Chatterjee, Mike Atia: Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test. European Test Symposium 2006: 165-172
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDonghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee: Low Cost Parametric Failure Diagnosis of RF Transceivers. European Test Symposium 2006: 205-212
2005
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShalabh Goyal, Michael Purtell: Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester. Asian Test Symposium 2005: 14-17
2004
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLGanesh Srinivasan, Shalabh Goyal, Abhijit Chatterjee: Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits. Asian Test Symposium 2004: 302-307

Coauthor Index

1Mike Atia [4]
2Soumendu Bhattacharya [3]
3Abhijit Chatterjee [1] [3] [4] [5] [6]
4Donghoon Han [3]
5Michael Purtell [2] [5]
6Ganesh Srinivasan [1]

Copyright © Mon Nov 16 17:22:42 2009 by Michael Ley (ley@uni-trier.de)