Torsten Grüning

	1991
3		Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners: DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. ICCAD 1991: 194-197
	1990
2		Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan: Accelerated test pattern generation by cone-oriented circuit partitioning. EURO-DAC 1990: 418-421
1		Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn: Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. ICCAD 1990: 222-225

Coauthor Index

1	Wilfried Daehn	[1] [2]
2	Hartmut Koopmeiners	[3]
3	Udo Mahlstedt	[1] [2] [3]
4	Cengiz Özcan	[1] [2]