Guido Gronthoud

	2007
14		Jens Anders, Shaji Krishnan, Guido Gronthoud: Re-configuration of sub-blocks for effective application of time domain tests. DATE 2007: 707-712
13		Bram Kruseman, Ananta K. Majhi, Guido Gronthoud: On Performance Testing with Path Delay Patterns. VTS 2007: 29-34
12		Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen: Memory Testing Under Different Stress Conditions: An Industrial Evaluation CoRR abs/0710.4693: (2007)
11		Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger: Modeling Power Supply Noise in Delay Testing. IEEE Design & Test of Computers 24(3): 226-234 (2007)
	2006
10		Xinyue Fan, Will Moore, Camelia Hora, Mario H. Konijnenburg, Guido Gronthoud: A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. VTS 2006: 266-271
9		Amir Zjajo, José Pineda de Gyvez, Guido Gronthoud: Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits. J. Electronic Testing 22(4-6): 399-409 (2006)
	2005
8		Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen: Memory Testing Under Different Stress Conditions: An Industrial Evaluation. DATE 2005: 438-443
7		Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg: A New Algorithm for Dynamic Faults Detection in RAMs. VTS 2005: 177-182
6		José Pineda de Gyvez, Guido Gronthoud, Rashid Amine: Multi-VDD Testing for Analog Circuits. J. Electronic Testing 21(3): 311-322 (2005)
	2004
5		Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger: On Hazard-free Patterns for Fine-delay Fault Testing. ITC 2004: 213-222
4		José Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, Manfred Koller: Power Supply Ramping for Quasi-static Testing of PLLs. ITC 2004: 980-987
	2003
3		José Pineda de Gyvez, Guido Gronthoud, Rashid Amine: VDD Ramp Testing for RF Circuits. ITC 2003: 651-658
2		Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger: Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. VTS 2003: 345-350
	2000
1		Will Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg: Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? ITC 2000: 95-104

Coauthor Index

1	Rashid Amine	[3] [6]
2	Jens Anders	[14]
3	Mohamed Azimane	[7] [8] [12]
4	Keith Baker	[1]
5	Fred Bowen	[8] [12]
6	Thomas Burger	[4]
7	Cristiano Cenci	[4]
8	Stefan Eichenberger	[2] [5] [8] [11] [12]
9	Xinyue Fan	[10]
10	José Pineda de Gyvez	[3] [4] [6] [9]
11	Camelia Hora	[2] [10]
12	Manfred Koller	[4]
13	Mario H. Konijnenburg (M. H. Konijnenburg)	[10]
14	Shaji Krishnan	[14]
15	Bram Kruseman	[5] [11] [13]
16	Maurice Lousberg	[1] [2] [7] [8] [12]
17	Xiang Lu	[11]
18	Ananta K. Majhi	[2] [5] [7] [8] [11] [12] [13]
19	Will Moore	[1] [10]
20	Martin Posch	[4]
21	Pop Valer	[2]
22	Luis Elvira Villagra	[11]
23	D. M. H. Walker (Duncan M. Hank Walker)	[11]
24	Jing Wang	[11]
25	Paul J. A. M. van de Wiel	[11]
26	Amir Zjajo	[9]

Colors in the list of coauthors